Zobrazeno 1 - 1
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pro vyhledávání: '"Jian-Kwan Li"'
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 11:387-390
A number of intricate configurations have been proposed to enhance the thermal stability of state-of-the-art power heterojunction bipolar transistors (HBTs). Existing structures for alleviating temperature-interference effects within HBTs are neverth
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9e9ac7789626c8ae74790095a0282e20
https://doi.org/10.1109/tdmr.2011.2141995
https://doi.org/10.1109/tdmr.2011.2141995
