Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Jian Wei Ho"'
Autor:
Shien-Ping Feng, Yuanhang Cheng, Hin-Lap Yip, Yufei Zhong, Patrick W K Fong, Gang Li, Annie Ng, Cong Chen, Luigi Angelo Castriotta, Fabio Matteocci, Luigi Vesce, Danila Saranin, Aldo Di Carlo, Puqun Wang, Jian Wei Ho, Yi Hou, Fen Lin, Armin G Aberle, Zhaoning Song, Yanfa Yan, Xu Chen, Yang (Michael) Yang, Ali Asgher Syed, Ishaq Ahmad, Tiklun Leung, Yantao Wang, JingYang Lin, Alan Man Ching Ng, Yin Li, Firouzeh Ebadi, Wolfgang Tress, Giles Richardson, Chuangye Ge, Hanlin Hu, Masoud Karimipour, Fanny Baumann, Kenedy Tabah, Carlos Pereyra, Sonia R Raga, Haibing Xie, Monica Lira-Cantu, Mark V Khenkin, Iris Visoly-Fisher, Eugene A Katz, Yana Vaynzof, Rosario Vidal, Guicheng Yu, Haoran Lin, Shuchen Weng, Shifeng Wang, Aleksandra B Djurišić
Publikováno v:
JPhys Materials, Vol 6, Iss 3, p 032501 (2023)
Perovskite solar cells (PSCs) represent one of the most promising emerging photovoltaic technologies due to their high power conversion efficiency. However, despite the huge progress made not only in terms of the efficiency achieved, but also fundame
Externí odkaz:
https://doaj.org/article/d38ed956d312490d97c579f3d52d2e25
Publikováno v:
Solar Energy. 233:494-503
Autor:
Wei Chen, Yudong Zhu, Jingwei Xiu, Guocong Chen, Haoming Liang, Shunchang Liu, Hansong Xue, Erik Birgersson, Jian Wei Ho, Xinshun Qin, Jingyang Lin, Ruijie Ma, Tao Liu, Yanling He, Alan Man-Ching Ng, Xugang Guo, Zhubing He, He Yan, Aleksandra B. Djurišić, Yi Hou
Publikováno v:
Nature Energy. 7:229-237
Autor:
Armin G. Aberle, Juan J. Diaz Leon, Sylvain Nicolay, Divya Ananthanarayanan, Jian Wei Ho, Johnson Wong
Publikováno v:
Solar Energy. 209:424-430
Mid-infrared spectroscopic characterization of doped layers is a rapid, contactless and non-destructive method of determining doped semiconductor layer properties, being used as an inline monitoring tool in industrial environments. Extending this tec
Publikováno v:
IEEE Journal of Photovoltaics. 10:159-165
A general computational routine which seeks cell parameters that best explain a set of luminescence imaging data is presented in this article. The routine combines Griddler, a finite-element simulator for solar cells, and tailored multivariate regres
Autor:
Samuel Raj, Armin G. Aberle, Carlos D. Rodriguez-Gallegos, Amit Singh Rajput, Jai Prakash Singh, Jian Wei Ho, Srinath Nalluri
Publikováno v:
Solar Energy. 194:688-695
A fast and non-destructive method based on electroluminescence (EL) imaging is presented to extract the front side resistive loss for individual cells within a crystalline silicon photovoltaic module. As the local luminescence intensity of a solar ce
Publikováno v:
Silicon Solar Cell Metallization and Module Technology ISBN: 9781839531552
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4359c3b6df5b456cc698a531804179a7
https://doi.org/10.1049/pbpo174e_ch2
https://doi.org/10.1049/pbpo174e_ch2
Publikováno v:
IEEE Journal of Photovoltaics. 9:643-651
A systematic routine to determine the front and rear metal induced recombination losses of bifacial silicon solar cells using an automated Griddler finite-element method fit procedure is presented in this paper. The method prescribes the preparation
Autor:
Jian Wei Ho, Johnson Wong, Mengjie Li, Vinodh Shanmugam, Armin G. Aberle, John Rodriguez, Woon Loong Choy, Balaji Nagarajan, Jammaal Kitz Buatis, Lujia Xu, Ning Chen, Er-Chien Wang, Shubham Duttagupta
Publikováno v:
Solar Energy Materials and Solar Cells. 187:91-96
This paper outlines the development of fully screen-printed, uniformly diffused, bifacial, n-type silicon solar cells produced using a lean processing sequence and industry-standard equipment. An average batch efficiency of 21.4% was measured at stan
Autor:
Jian Wei Ho, Britta Mette, Xin Zheng, Bernhard Mitchell, Johnson Wong, Sascha Esefelder, Divya Ananthanarayanan, Kwan Bum Choi
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
Rapid and non-contact doped layer characterization using mid-IR reflectance and transmittance measurement is a proven inline monitoring approach commercially used in the production lines. Extending this technique to correlate to the end-of-line cell