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pro vyhledávání: '"Ji Woon Rim"'
Autor:
Hansoo Kim, Hyung Mo Yang, Ji Woong Sue, Seok Sik Kim, Juhyeon Ahn, Ji Woon Rim, Ki Hyun Hwang, Sang In Kim, Hee Seong Yang, Yu Gyun Shin, Sun Kyu Whang, Woon Kyung Lee, Han Ku Cho
Publikováno v:
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
The technology of increasing Internal Vcc without using memory tester is used to enhance the photon emission and the failure range is defined in detail by nano probing. With these methods, we found out that the leakage current was caused by dislocati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04c6158357453ec664b37185fab766b4
https://doi.org/10.1109/ipfa.2012.6306313
https://doi.org/10.1109/ipfa.2012.6306313
