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Autor:
Meen TH; Department of Electronic Engineering, National Formosa University, Yunlin, 632, Taiwan. thmeen@nfu.edu.tw., Jhuo YT, Chao SM, Lin NY, Ji LW, Tsai JK, Wu TC, Chen WR, Water W, Huang CJ
Publikováno v:
Nanoscale research letters [Nanoscale Res Lett] 2012 Oct 23; Vol. 7 (1), pp. 579. Date of Electronic Publication: 2012 Oct 23.