Zobrazeno 1 - 6
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pro vyhledávání: '"Jheng-Syun Lee"'
Autor:
Jheng-Syun Lee, 李政勳
104
This study modifies the Salop (1979) research hypothesis to analyze duopoly competition, how firms strategically use the location and persuasive advertisement to compete.Particularly, the persuasive advertisement are used to influence the co
This study modifies the Salop (1979) research hypothesis to analyze duopoly competition, how firms strategically use the location and persuasive advertisement to compete.Particularly, the persuasive advertisement are used to influence the co
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/63560182350763296161
Autor:
Jheng-Syun Lee, 李政勳
92
The microstructure of Y5V-1206 capacitor has been studied using X-ray diffractometry (XRD), scanning electron microscope (SEM), and transmission electron microscope (TEM). Twinning occurs when a crystal undergoes a shear stress which produces
The microstructure of Y5V-1206 capacitor has been studied using X-ray diffractometry (XRD), scanning electron microscope (SEM), and transmission electron microscope (TEM). Twinning occurs when a crystal undergoes a shear stress which produces
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/92061070130895980409
Publikováno v:
Materials Letters. 194:23-25
Copper metallization with dense nanoscale coherent twin boundaries (CTBs) have demonstrated many spectacular properties that are generally curtailed by the CTB spacing. In this study, electroplated Cu nanowires (CuNWs) with pseudo periodic twinning s
Publikováno v:
Nanoscale. 10(21)
Lattice-mismatch is an important factor for the heteroepitaxial growth of core-shell nanostructures. A large lattice-mismatch usually leads to a non-coherent interface or a polycrystalline shell layer. In this study, a conformal Ag layer is coated on
Publikováno v:
Journal of Electroceramics. 18:13-24
The Y5V-1206 base-metal electrode (BME) multilayer ceramic capacitor (MLCC) chips have been characterised for crystalline phases using X-ray diffractometry (XRD), and microstructure using optical microscopy (OM), scanning electron microscopy (SEM) an
Publikováno v:
Journal of Electroceramics; Apr2007, Vol. 18 Issue 1/2, p13-24, 12p