Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Jesus Eduardo Lugo Arce"'
Autor:
Argelia Pérez-Pacheco, Fernando Yael Rodríguez Morales, Khashayar Misaghian, Jocelyn Faubert, Jesus Eduardo Lugo Arce
Publikováno v:
Biology, Vol 13, Iss 8, p 631 (2024)
Noise is commonly seen as a disturbance but can influence any system it interacts with. This influence may not always be desirable, but sometimes it can improve the system’s performance. For example, stochastic resonance is a phenomenon where addin
Externí odkaz:
https://doaj.org/article/51887358088f4ff89fef0c739638539a
Autor:
María del Rayo Jiménez Vivanco, Godofredo García, Rafael Doti, Jocelyn Faubert, Jesus Eduardo Lugo Arce
Publikováno v:
Materials, Vol 11, Iss 6, p 894 (2018)
In this work, we have followed ethanol evaporation at two different concentrations using a fiber optic spectrometer and a screen capture application with a resolving capacity of 10 ms. The transmission spectra are measured in the visible-near-infrare
Externí odkaz:
https://doaj.org/article/6f540bcffb404079bfb451f22cfc9ff2
Autor:
Jocelyn Faubert, Jesús Carrillo López, Godofredo Garcia Salgado, Jesus Eduardo Lugo Arce, Tomas Diaz Becerril, María del Rayo Jiménez Vivanco, Crisóforo Morales Ruiz, Vivechana Agarwal, José Alberto Luna López, Reina Galeazzi Isasmendi, Enrique Rosendo Andrés, Roman Romano Trujillo, Gabriela Nieto Caballero, Rafael Doti, Antonio Coyopol Solis
Publikováno v:
Nanophotonic Materials XV.
The theoretical and experimental study of porous silicon-based UV microcavities is discussed in this work. The obtaining of CMs in the Ultraviolet range expands the field of research of porous silicon photonic structures. The porous silicon microcavi
Autor:
NOEMI SANCHEZ CASTRO
Publikováno v:
Instituto Nacional de Astrofísica, Óptica y Electrónica
INAOE
Repositorio Institucional del INAOE
INAOE
Repositorio Institucional del INAOE
En este trabajo, estudiamos teórica y experimentalmente la inducción de fuerzas electromagnéticas en cristales fotónicos unidimensionales con defectos localizados cuando la luz incide transversalmente en la capa defecto. Los cálculos teóricos i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3056::fc79750c461b16d072d2d9a517bf8f58
http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/194
http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/194