Zobrazeno 1 - 10
of 34
pro vyhledávání: '"Jesus Blanco-Garcia"'
Autor:
Jesus Blanco-Garcia
Publikováno v:
The Mariner's Mirror. 102:338-344
The maritime culture of Galicia on the northern Spanish coast was a crossroads between the Mediterranean and northern Europe. By the late Middle Ages a relatively uniform Atlantic tradition in term...
Autor:
Jose Luis Valencia-Alvarez, José B. Vazquez-Dorrio, J. Diz-Bugarin, Jesus Blanco-Garcia, Ismael Outumuro-Gonzalez
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 65:407-412
This paper presents a new electronic Vernier fringe counter for the wavelength measurement of a diode laser in a scanning interferometer. The system is intended to be a low cost alternative to commercial systems used for gauge block calibration. The
Publikováno v:
Measurement Science and Technology. 12:644-651
In this work we report results on analysis of in-plane deformation using the symmetrical illumination technique. A single illumination source is doubled by means of a mirror placed perpendicular to the object being tested. Carrier fringes are introdu
Autor:
J. Bugarin, Antonio Fernández, Benito V. Dorrío, Ángel F. Doval, José L. Fernández, Carlos Silva López, Jose M. Alen, Mariano Perez-Amor, Jesus Blanco-Garcia
Publikováno v:
Applied optics. 37(16)
We report the measurement of transient bending waves with double-pulsed-subtraction TV holography. The correlation fringe patterns are automatically quantitatively analyzed by the application of Fourier methods. A novel optical setup with two differe
Publikováno v:
4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications.
A novel approach to surface contouring using two-source phase-stepping digital shearography is proposed. In this technique, the illumination source is displaced in a prescribed manner to produce a phase difference increment. For a particular experime
Autor:
F. A. Ribas-Perez, Jesus Blanco-Garcia
Publikováno v:
4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications.
In this work, we demonstrate the possibility to apply the multiple source photometry to obtain in a simple and direct way the derivatives of the surface point displacements of perpendicularly loaded plates. The factors affecting the sensitivity of th
Autor:
Guillermo H. Kaufmann, José L. Fernández, Jesus Blanco-Garcia, Ángel F. Doval, Carlos Perez-Lopez, Antonio Fernández, A. Dávila
Publikováno v:
Investigo. Repositorio Institucional de la Universidade de Vigo
Universidade de Vigo (UVigo)
Universidade de Vigo (UVigo)
Jose L. Fernandez Universidad de Vigo Department of Applied Physics Escuela Tecnica Superior de Ingenieros Industriales Campus Universitario Lagoas-Marcosende E-36200 Vigo, Spain Abstract. We report a technique for the measurement of transient outof-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e56af9b94767415f100958081cf096ec
http://opticalengineering.spiedigitallibrary.org/article.aspx?doi=10.1117/1.1305260
http://opticalengineering.spiedigitallibrary.org/article.aspx?doi=10.1117/1.1305260
Publikováno v:
Interferometry in Speckle Light ISBN: 9783642632303
We present a technique to evaluate in-plane ESPI fringe patterns by the Fourier Transform Method (FTM). The spatial carrier is introduced, as in some contouring techniques, by symmetrically shifting the illumination beams. We present a three-dimensio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c07f3bf95bb5b15e7f9ac4146a60f18
https://doi.org/10.1007/978-3-642-57323-1_34
https://doi.org/10.1007/978-3-642-57323-1_34
Autor:
A. Dávila, José L. Fernández, Jesus Blanco-Garcia, Ángel F. Doval, Carlos Perez-Lopez, Antonio Fernández
Publikováno v:
SPIE Proceedings.
We report on a novel technique for the evaluation of transient phase in double-pulsed electronic speckle-shearing pattern interferometry. Our technique requires the acquisition of just two speckle-shear interferograms which are correlated by subtract
Autor:
Antonio Fernández, Guillermo H. Kaufmann, Jesus Blanco-Garcia, José L. Fernández, Ángel F. Doval
Publikováno v:
Investigo. Repositorio Institucional de la Universidade de Vigo
Universidade de Vigo (UVigo)
Universidade de Vigo (UVigo)
Carrier removal is a key step in the Fourier transform method (FTM) of fringe pattern analysis because it can give rise to significant errors in the recovered phase. The existing methods of fringe carrier removal in the FTM are reviewed and a compari
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0176f4ecfe63aaef8177036762c7a4b0
http://hdl.handle.net/11093/1255
http://hdl.handle.net/11093/1255