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of 3
pro vyhledávání: '"Jessy Paterson"'
Autor:
Rebecca Chahine, Martina Tomelleri, Jessy Paterson, Mathieu Bernard, Nicolas Bernier, François Pierre, Denis Rouchon, Audrey Jannaud, Cristian Mocuta, Valentina M. Giordano, Françoise Hippert, Pierre Noé
Publikováno v:
Journal of Materials Chemistry C. 11:269-284
Engineering of chalcogenide phase-change materials at the nanoscale is required to improve the performances of ultimate size memory devices and reduce their power consumption.
Autor:
Clivia M. Sotomayor-Torres, Juliana Jaramillo Fernandez, Daniel Bourgault, David Lacroix, Dhruv Singhal, Laurent Cagnon, Dimitri Tainoff, Olivier Bourgeois, Jacques Richard, Jessy Paterson, Emigdio Chavez-Angel, Meriam Ben-Khedim, Denis Buttard
Publikováno v:
Digital.CSIC. Repositorio Institucional del CSIC
instname
Dipòsit Digital de Documents de la UAB
Universitat Autònoma de Barcelona
Nanoscale
Nanoscale, Royal Society of Chemistry, 2019, 11 (28), pp.13423-13430. ⟨10.1039/C9NR01566C⟩
Nanoscale, 2019, 11 (28), pp.13423-13430. ⟨10.1039/C9NR01566C⟩
instname
Dipòsit Digital de Documents de la UAB
Universitat Autònoma de Barcelona
Nanoscale
Nanoscale, Royal Society of Chemistry, 2019, 11 (28), pp.13423-13430. ⟨10.1039/C9NR01566C⟩
Nanoscale, 2019, 11 (28), pp.13423-13430. ⟨10.1039/C9NR01566C⟩
Pnictogen and chalcogenide compounds have been seen as high-potential materials for efficient thermoelectric conversion over the past few decades. It is also known that with nanostructuration, the physical properties of these pnictogen–chalcogenide
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0fcf5dab82012200f777b29b94b6a60b
http://hdl.handle.net/10261/200790
http://hdl.handle.net/10261/200790
Publikováno v:
Journal of Applied Physics
Journal of Applied Physics, American Institute of Physics, 2020, 127 (24), pp.245105. ⟨10.1063/5.0004576⟩
Journal of Applied Physics, American Institute of Physics, 2020, 127 (24), pp.245105. ⟨10.1063/5.0004576⟩
Sub-nanometer thickness accuracy and excellent conformity make atomic layer deposited films prevalent in modern electronics, continuously shrinking in size. The thermal resistance of these films plays a major role in the overall energy efficiency of