Backside Shield against Physical Attacks for Secure ICs

Autor: Philippe Medina, Romain Wacquez, Eric Jalaguier, Edouard Deschaseaux, Christophe Plantier, Jessy Clédière, Stéphanie Anceau, Gilles Simon, Jacques Fournier, Jean Charbonnier, Stephan Borel

Publikováno v: Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT). 2017:1-15

Although the implementation of multiple countermeasures, both hardware and software, are making integrated circuits more and more secure, the backside of a chip is still considered as a vulnerability regarding physical attacks. A novel protection str

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3162dde956eaa2e6733f2d2c57d2d3a1
https://doi.org/10.4071/2017dpc-wp1_presentation2

A Novel Structure for Backside Protection Against Physical Attacks on Secure Chips or SiP

Autor: Jessy Clédière, Gilles Simon, Edouard Deschaseaux, L. Duperrex, Jean Charbonnier, Jean-Charles Souriau, A. Merle, Stephan Borel, Romain Wacquez, Jacques Fournier

Publikováno v: 2018 IEEE 68th Electronic Components and Technology Conference (ECTC)
2018 IEEE 68th Electronic Components and Technology Conference (ECTC), May 2018, San Diego, United States. pp.515-520, ⟨10.1109/ECTC.2018.00081⟩

International audience; A structure intended to protect Integrated Circuits (IC) against physical attacks is presented. Located on the backside of a chip, it complements the countermeasures usually available on the front side of secure components. It

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::09a5361672380fd802ea5d4f81fd17e0
https://hal-cea.archives-ouvertes.fr/cea-02185285/document

Fault Analysis and Evaluation of a True Random Number Generator Embedded in a Processor

Autor: Mathilde Soucarros, Cécile Dumas, Philippe Elbaz-Vincent, Jessy Clédière

Publikováno v: Journal of Electronic Testing. 29:367-381

True Random Number Generators have many uses, in particular they play a key role in security applications and cryptographic algorithms. Our interest lies in the quality of their generated random numbers. More specifically, for such utilizations, a sl

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::027432aa6ca6e00148f405d2e8f6679f
https://doi.org/10.1007/s10836-013-5356-1

Evidence of an information leakage between logically independent blocks

Autor: Loic Zussa, Jean-Max Dutertre, Assia Tria, Jessy Clédière, Ingrid Exurville, Jean-Baptiste Rigaud, Bruno Robisson

Publikováno v: Proceedings of the Second Workshop on Cryptography and Security in Computing Systems
Second Workshop on Cryptography and Security in Computing Systems (CS2'2015)
Second Workshop on Cryptography and Security in Computing Systems (CS2'2015), Jan 2015, Amsterdam, Netherlands. pp.25, ⟨10.1145/2694805.2694810⟩
CS2@HiPEAC

International audience; In this paper we study the information leakage that may exist, due to electrical coupling, between logically independent blocks of a secure circuit as a new attack path to retrieve secret information. First, an AES-128 has bee

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4876a1eb8da79ebca2a1fa57f5d81bb0
https://hal.archives-ouvertes.fr/hal-01855795/document

Influence of the temperature on true random number generators

Autor: Cecile Canovas-Dumas, Jessy Clédière, Denis Réal, Philippe Elbaz-Vincent, Mathilde Soucarros

Publikováno v: HOST

Today TRNGs are used in many different applications. The quality of their randomness is determined by these applications: for example those with security requirements need very good random numbers while simulations have fewer constraints on their pro

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6d66da30314241d64ccb9b4a66cbd593
https://doi.org/10.1109/hst.2011.5954990