Zobrazeno 1 - 10
of 69
pro vyhledávání: '"Jerzy B. Pelka"'
Autor:
Dorota Klinger, Marek Jurek, Igor Alexandrovich Makhotkin, Karel Saksl, Michael Störmer, Jerzy B. Pelka, Eric Louis, Sven Toleikis, Vojtech Vozda, Marion Kuhlmann, Iwanna Jacyna, Tomáš Burian, Siegfried Schreiber, Sebastian Strobel, Jaromír Chalupský, Hartmut Enkisch, Mabel Ruiz-Lopez, Frank Siewert, Barbara Keitel, Thomas Wodzinski, Martin Hermann, Vera Hájková, R.A. Loch, Gosse de Vries, Libor Juha, Elke Plönjes, Kai Tiedtke, Tobias Mey, Ryszard Sobierajski, Frank Scholze
Publikováno v:
Optics Damage and Materials Processing by EUV/X-ray Radiation VII.
An accurate transmission measurement of thin foils (usually made of elemental metals and/or semiconductors), which routinely are used as attenuators in soft x-ray beamlines, end-stations and instruments, represents a long standing problem over the wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cbe59645973d80dc96a4a15de0687346
https://doi.org/10.1117/12.2524718
https://doi.org/10.1117/12.2524718
Autor:
Marc Messerschmidt, Alexander Graf, Jerzy B. Pelka, Ryszard Sobierajski, D. Żymierska, Dorota Klinger, Krzysztof Wieteska, John D. Bozek, Jérôme Gaudin, Stefan P. Hau-Riege, Richard A. London, Carsten Paulmann, Wojciech Wierzchowski, Jacek Krzywinski, Stefan Moeller, Tomáš Burian, Christoph Bostedt, Jaromír Chalupský
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 364:20-26
The silicon sample irradiated with femtosecond soft X-ray pulses at the Linac Coherent Light Source has been studied with several synchrotron X-ray diffraction topographic methods at HASYLAB. The irradiations were performed for two different waveleng
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c02e778789d382d283d3478d090df386
https://doi.org/10.1016/j.nimb.2015.07.115
https://doi.org/10.1016/j.nimb.2015.07.115
Autor:
Robbert Wilhelmus Elisabeth van de Kruijs, Gosse de Vries, Libor Juha, Iwanna Jacyna, Marek Jurek, Dorota Klinger, M.A. Smithers, Frank Scholze, Sebastian Strobel, Tomáš Burian, Hartmut Enkisch, Eric Louis, Karel Saksl, Barbara Keitel, Sven Toleikis, Martin Hermann, Siegfried Schreiber, Jerzy B. Pelka, V. Vozda, Konstantin Nikolaev, Henk van Wolferen, Bart Faatz, Elke Plönjes, Ryszard Sobierajski, R.A. Loch, Enrico G. Keim, Rilpho Ludovicus Donker, Frank Siewert, Igor Alexandrovich Makhotkin, Igor Milov, Tobias Mey, Kai Tiedtke, Jaromír Chalupský, Jacobus Marinus Sturm, Věra Hájková
Publikováno v:
Journal of the Optical Society of America. B: Optical physics, 35(11), 2799-2805. Optica Publishing Group
The process of damage accumulation in thin ruthenium films exposed to multiple femtosecond extreme ultraviolet (XUV) free-electron laser (FEL) pulses below the critical angle of reflectance at the FEL facility in Hamburg (FLASH) was experimentally an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::07e1a215a062e4a4fc0445c3f6b012e8
https://research.utwente.nl/en/publications/eed0f8e1-4757-4ead-a45f-61cc77928423
https://research.utwente.nl/en/publications/eed0f8e1-4757-4ead-a45f-61cc77928423
Autor:
Stefan P. Hau-Riege, Michael Rowen, A.R. Khorsand, T. Whitcher, H. Wabnitz, Makina Yabashi, Libor Juha, Marta Fajardo, Nicusor Timneanu, Sam Vinko, Jerzy B. Pelka, Pavel Boháček, Dorota Klinger, David Riley, Roland R. Fäustlin, Tomáš Burian, Harald Sinn, Michele Swiggers, Ryszard Sobierajski, Joshua J. Turner, Marc Messerschmidt, Philip Heimann, Stefan Moeller, Vera Hájková, Marek Jurek, Ludek Vysin, Maria V. Kozlova, Robert Nagler, Mitsuru Nagasono, Jérôme Gaudin, Thomas Dzelzainis, Art J. Nelson, William F. Schlotter, Janos Hajdu, Oldrich Renner, Kai Tiedtke, Richard W. Lee, Vojtech Vozda, Karel Saksl, Justin Wark, Sven Toleikis, Jakob Andreasson, Jaromír Chalupský, Jacek Krzywinski, Thomas Tschentscher, Bianca Iwan
Publikováno v:
Damage to VUV, EUV, and X-ray Optics VI.
Interaction of short-wavelength free-electron laser (FEL) beams with matter is undoubtedly a subject to extensive investigation in last decade. During the interaction various exotic states of matter, such as warm dense matter, may exist for a split s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8234a5a966286021aa6813b014c1ae5
https://doi.org/10.1117/12.2270944
https://doi.org/10.1117/12.2270944
Autor:
Kamil Sobczak, Jerzy B. Pelka, Danek Elbaum, Paweł Dłużewski, Krzysztof Fronc, Anna Baranowska-Korczyc, Dorota Klinger
Publikováno v:
Radiation Physics and Chemistry. 93:21-24
This work reports structural properties of room temperature ferromagnetic Fe doped ZnO nanofibers (NFs). The NFs were obtained by electrospinning and calcination in air. The input atomic ratio of Fe to Zn ions was about 0.1. The structural characteri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f22f49ec085c7db29c761b11f5aa1e24
https://doi.org/10.1016/j.radphyschem.2013.02.038
https://doi.org/10.1016/j.radphyschem.2013.02.038
Autor:
Tomáš Burian, Libor Juha, T. Balcer, H. Wabnitz, Dorota Klinger, Ryszard Sobierajski, D. Żymierska, Sven Toleikis, Thomas Tschentscher, A.J. Gleeson, Carsten Paulmann, Wojciech Wierzchowski, Harald Sinn, Jaromír Chalupský, L. Vysin, D. Sobota, K. Tiedtke, Jérôme Gaudin, Jerzy B. Pelka, Věra Hájková, Krzysztof Wieteska
Publikováno v:
Radiation Physics and Chemistry. 93:99-103
Silicon crystalline samples were exposed to intense single pulses of XUV radiation ( λ =13.5 nm) what lead to melting and ablation of the surface material. The deformation field around craters along the whole thickness of silicon wafers was observed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::876c79884906376c245ad36baa4e7bfa
https://doi.org/10.1016/j.radphyschem.2013.04.025
https://doi.org/10.1016/j.radphyschem.2013.04.025
Autor:
D. Żymierska, B. Kozankiewicz, L. Nowicki, Dorota Klinger, Roman Minikayev, K. Nowakowska-Langier, Jerzy B. Pelka, W. Caliebe
Publikováno v:
Radiation Physics and Chemistry. 80:1064-1067
Silicon single crystals were implanted with Ge or Sn ions and then annealed by nanosecond laser beam in a single-pulse mode. The structural changes caused by the laser annealing are studied by means of the Rutherford back-scattering and X-ray diffrac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d49c8c472165762ba43b4c7ed3575e3a
https://doi.org/10.1016/j.radphyschem.2011.03.017
https://doi.org/10.1016/j.radphyschem.2011.03.017
Publikováno v:
Acta Physica Polonica A. 117:427-432
The advent of free electron lasers opens up new opportunities to probe the dynamics of ultrafast processes and the structure of matter with unprecedented spatial and temporal resolution. New methods inaccessible with other known types of radiation so
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be09089f68081a7a5f5de13c6c4d4164
https://doi.org/10.12693/aphyspola.117.427
https://doi.org/10.12693/aphyspola.117.427
Autor:
Jerzy B. Pelka
Publikováno v:
Radiation Physics and Chemistry. 78:S142-S148
The article presents a possible outline of a biomedical facility project at the 3 GeV Polish synchrotron light source, the construction of which is in the next few years under consideration. The aim of the facility is to apply the X-ray techniques fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::39a3c26034c94477fd8bc0b7c03fc2bd
https://doi.org/10.1016/j.radphyschem.2009.04.032
https://doi.org/10.1016/j.radphyschem.2009.04.032
Autor:
Klaus Sokolowski-Tinten, Jaromir Chalupsky, C. Riekel, A. Petroutchik, Libor Juha, Richard A. London, Dorota Klinger, Richard J. Davies, Jacek Krzywinski, W. Caliebe, J. Cihelka, Stefan P. Hau-Riege, W. Szuszkiewicz, Ryszard Sobierajski, Sven Toleikis, L. Vysin, W. Paszkowicz, Nikola Stojanovic, Manfred Burghammer, Robert Nietubyć, Ulf Zastrau, Marek Jurek, Andrzej Wawro, Věra Hájková, Jerzy B. Pelka, Tomáš Burian, Elżbieta Dynowska, D. Zymierska
Publikováno v:
Radiation Physics and Chemistry. 78:S46-S52
The article presents preliminary investigation results on the near-surface damage produced by single pulses of XUV free-electron laser in the amorphous α-SiO 2 , the monocrystalline silicon and the epitaxial films of gold. The irradiation was delive
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::882a51bf6189222fbb876e37d42c085e
https://doi.org/10.1016/j.radphyschem.2009.06.006
https://doi.org/10.1016/j.radphyschem.2009.06.006