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Autor:
Mehul A. Trivedi, Roger F. Dickey, Paul Pinsukanjana, Jared Hubbard, Yung-Chung Kao, Philip S. Kao, J. Marquis, Sam P. Kuo, Jerry M.-S. Tsai
Publikováno v:
Journal of Crystal Growth. 251:124-129
Atomic absorption optical-based flux monitor (OFM) has been implemented as a non-invasive in situ measurement tool for production MBE operation. For our setup, the optical probe beam samples the group III beam fluxes (Al, Ga, and In) by passing just
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f6cd2140da9c388dadb9497762a139f
https://doi.org/10.1016/s0022-0248(02)02293-5
https://doi.org/10.1016/s0022-0248(02)02293-5
