Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Jeongin Choe"'
Publikováno v:
2022 International Conference on Electronics, Information, and Communication (ICEIC).
Autor:
Jai Hyuk Song, Saetbyeol Yoon, Jeongin Choe, Woo Young Choi, Ki-whan Song, Myung-Suk Kim, Kim Taehyeon, Sangyong Yoon
Publikováno v:
International Symposium for Testing and Failure Analysis.
We have adopted various defect detection systems in the front stage of manufacturing in order to effectively manage the quality of flash memory products. In this paper, we propose an intelligent pattern recognition methodology which enables us to dis