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pro vyhledávání: '"Jeonghyun Wang"'
Autor:
Yunje Cho, Junghee Cho, Jonghyeok Park, Jeonghyun Wang, Seunggyo Jeong, Jubok Lee, Yun Hwang, Jiwoong Kim, Jeongwoo Yu, Heesu Chung, Hyenok Park, Subong Shon, Taeyong Jo, Myungjun Lee, Kwangrak Kim
Publikováno v:
Communications Engineering, Vol 3, Iss 1, Pp 1-15 (2024)
Abstract Scanning Electron Microscopy (SEM) leverages electron wavelengths for nanoscale imaging, necessitating precise parameter adjustments like focus, stigmator, and aperture alignment. However, traditional methods depend on skilled personnel and
Externí odkaz:
https://doaj.org/article/3081f2f02e954ba4b70368661b0facac
