Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Jeong-Hee Ha"'
Autor:
Jeong-Hee Ha
Publikováno v:
Korean Society for Critical Inquiry of Childhood Education. 11:5-26
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7e071bb7a95e735aeff2196a4c08edf
https://doi.org/10.26834/kscice.2021.04.15.5
https://doi.org/10.26834/kscice.2021.04.15.5
Autor:
Jeong-Hee Ha
Publikováno v:
The Korea Association for Early Childhood Education and Educare Welfare. 23:65-98
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5ad6358312cdc8aa72e759f87b56a6ea
https://doi.org/10.22590/ecee.2019.23.3.65
https://doi.org/10.22590/ecee.2019.23.3.65
Autor:
Jeong-Hee Ha, You-Jeong Kim
Publikováno v:
The Korea Association for Early Childhood Education and Educare Welfare. 21:27-49
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd15b07c95a2e4346b03c1da76597686
https://doi.org/10.22590/ecee.2017.21.4.27
https://doi.org/10.22590/ecee.2017.21.4.27
Autor:
Jeong-Hee Ha, Jong-Man Lee
Publikováno v:
Journal of Digital Convergence. 15:393-403
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8676f66f4fff9782ec38337abf3f5f8c
https://doi.org/10.14400/jdc.2017.15.2.393
https://doi.org/10.14400/jdc.2017.15.2.393
Autor:
Piero Pianetta, Husam N. Alshareef, Jeong-Hee Ha, Luigi Colombo, Paul C. McIntyre, Yun Sun, James J. Chambers
Publikováno v:
ECS Transactions. 11:213-218
Photoelectron spectroscopy and transmission electron microscopy provide clear experimental evidence to show that oxygen initially present in the W gate layer of a metal/high-k gate stack is transferred to the substrate and increases the interfacial o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5cea45562a823769661425336980c754
https://doi.org/10.1149/1.2779562
https://doi.org/10.1149/1.2779562
Publikováno v:
Applied Physics Letters. 85:5884-5886
In this letter, we report on phase separation kinetics at initially mixed interfaces of HfO2–SiO2 multilayers measured by low-angle x-ray scattering. Multilayers were fabricated by sputtering and ultraviolet ozone oxidation of ultrathin Hf and Si p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::186435e69a4f511475ca4af158bb450c
https://doi.org/10.1063/1.1831554
https://doi.org/10.1063/1.1831554
Autor:
Jeong-Hee Ha, Husam AlShareef, Jim Chambers, Yun Sun, Piero Pianetta, Paul McIntyre, Luigi Colombo
Publikováno v:
ECS Meeting Abstracts. :1132-1132
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::abfc485e278af9d163eee1bf6b52ea24
https://doi.org/10.1149/ma2007-02/20/1132
https://doi.org/10.1149/ma2007-02/20/1132
Publikováno v:
Applied Physics Letters. 90:112911
Effects of fluorine incorporation on the electrical properties of HfO2∕SiO2 dielectric stacks are investigated through both ab initio simulations and electrical measurements. The results show that F ions are able to remove midgap states resulting f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f99f6961f4f8e9bd2f96ff5a0a365ea9
https://doi.org/10.1063/1.2712785
https://doi.org/10.1063/1.2712785
Publikováno v:
Journal of Applied Physics. 101:033706
Density functional theory simulations of HfO2∕SiO2 interfaces predict the presence of midgap states associated with nonbonding Hf d electrons which result from the reduced oxygen coordination of near-interface Hf ions. These states are expected to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6722240680bf3a440d3da57873ced65a
https://doi.org/10.1063/1.2433696
https://doi.org/10.1063/1.2433696
Publikováno v:
Journal of Digital Convergence. Feb2017, Vol. 15 Issue 2, p393-403. 11p.