Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Jeong Y. Kim"'
Autor:
Jieun Kim, Soo-nam Jo, Seonju Yi, Eu S Kim, Yang L Kim, Yeon-Hee Sung Yi, Sungyong Choi, Won Suk Choi, Kyoung Ho Song, HyeJin Jeong, Hong B Kim, Kyung-Nam Kim, Jeong Y Kim, Eun Jung Park, Nayoung Kim, Heeyoung Lee, Yu-ra Lee
Publikováno v:
Online Journal of Public Health Informatics
Objective: The objectives are to introduce a provincial level surveillance system, which has been initiated in response to the MERS-CoV outbreak of South Korea, and describe findings from systematic investigation of individual admissions attributed t
Autor:
Giovanni Cavataio, Christine Kay Lambert, Jeong Y. Kim, James Robert Warner, Hungwen Jen, James W. Girard
Publikováno v:
SAE International Journal of Fuels and Lubricants. 1:477-487
Autor:
Jae Y. Oh, Yong K. Kwon, Byung Ki An, Jun H. Kwon, Eun G. Shin, Douglas R. Call, Jeong Y. Kim, Min S. Kang, Mi J. Kim, Gab S. Chung, Eun A. Song
Publikováno v:
Avian pathology : journal of the W.V.P.A. 40(6)
Salmonella enterica serovar Gallinarum causes a severe systemic disease, fowl typhoid, primarily in chickens and turkeys, and it remains a disease of worldwide significance. Multilocus variable-number tandem-repeat analysis (MLVA) has proved to be ve
Publikováno v:
Journal of the Society of Naval Architects of Japan. 1993:625-633
The previous plate buckling design formula proposed by the authors is advanced by taking into account the real rotational restraint effect of supporting members at edges. For this purpose, a series of the theoretical plate buckling analysis is perfor
Publikováno v:
SAE Technical Paper Series.
Publikováno v:
SAE Technical Paper Series.
Publikováno v:
SAE Technical Paper Series.
Publikováno v:
SAE Technical Paper Series.
This paper describes the pressure loss characteristics of a variety of substrates (with and without washcoat) that have different cell densities, lengths, and diameters. Both experimental and analytical approaches were used to determine pressure loss
Autor:
Jeong Y. Kim, Seha Son
Publikováno v:
SAE Technical Paper Series.
Autor:
Jeong Y. Kim, Alan Richardson
Publikováno v:
SAE Technical Paper Series.