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pro vyhledávání: '"Jennifer T. Adam"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 7, Iss 1, Pp 1736-1742 (2016)
Reflectometric interference spectroscopy (RIfS), which is well-established in the visual regime, measures the optical thickness change of a sensitive layer caused, e.g., by binding an analyte. When operated in the mid-infrared range the sensor provid
Externí odkaz:
https://doaj.org/article/b5004adfadca4727a51be1ecd04fca41
