Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Jennifer Rebellato"'
Autor:
Julien E. Rault, Evgueni Meltchakov, Franck Delmotte, Regina Soufli, Christopher C. Walton, Catherine Burcklen, Eric M. Gullikson, Jennifer Rebellato
Publikováno v:
Journal of Nanoscience and Nanotechnology
Journal of Nanoscience and Nanotechnology, American Scientific Publishers, 2019, 19 (1), pp.554-561. ⟨10.1166/jnn.2019.16480⟩
Journal of Nanoscience and Nanotechnology, American Scientific Publishers, 2019, 19 (1), pp.554-561. ⟨10.1166/jnn.2019.16480⟩
International audience; This paper demonstrates that highly reflective Cr/B 4 C multilayer interference coatings with nano-metric layer thicknesses, designed to operate in the soft X-ray photon energy range, have stable reflective performance for a p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::065268c3160387cb0ded5cd06ad3b7c0
https://doi.org/10.1166/jnn.2019.16480
https://doi.org/10.1166/jnn.2019.16480
Autor:
Jennifer Rebellato, Cédric Baumier, Florian Pallier, Eric M. Gullikson, Evgueni Meltchakov, Regina Soufli, Sébastien de Rossi, Franck Delmotte
Publikováno v:
Thin Solid Films. 735:138873
This manuscript presents the structural characterization of Al/Sc-based periodic multilayer coatings for the extreme ultraviolet (EUV) spectral range. Based on transmission electron microscopy and electron diffraction as well as grazing-incidence and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d3644732d1f28c772408e1f613de8ce
https://doi.org/10.1016/j.tsf.2021.138873
https://doi.org/10.1016/j.tsf.2021.138873
Autor:
Jennifer Rebellato, Regina Soufli, Franck Delmotte, Evgueni Meltchakov, Eric M. Gullikson, Sébastien de Rossi
Publikováno v:
Optics Letters
Optics Letters, Optical Society of America-OSA Publishing, 2020, 45 (4), pp.869-872. ⟨10.1364/OL.384734⟩
Optics Letters, Optical Society of America-OSA Publishing, 2020, 45 (4), pp.869-872. ⟨10.1364/OL.384734⟩
In this Letter, we have developed new and highly efficient periodic multilayer mirrors Al/Sc, Al/Sc/SiC, and Mo/Al/Sc with optimized reflectance at wavelengths between 40 and 65 nm. We have reached record values in measured peak reflectance: 57.5% at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b1098ac177060d8c50148a4071b7e07d
https://doi.org/10.1364/ol.384734
https://doi.org/10.1364/ol.384734
Autor:
Catherine, Burcklen, Regina, Soufli, Jennifer, Rebellato, Christopher, Walton, Evgueni, Meltchakov, Julien E, Rault, Eric, Gullikson, Franck, Delmotte
Publikováno v:
Journal of nanoscience and nanotechnology. 19(1)
This paper demonstrates that highly reflective Cr/B₄C multilayer interference coatings with nanometric layer thicknesses, designed to operate in the soft X-ray photon energy range, have stable reflective performance for a period of 3 years after de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::394b8fc8e425edfc9b1ea31176d84903
https://pubmed.ncbi.nlm.nih.gov/30327069
https://pubmed.ncbi.nlm.nih.gov/30327069
Autor:
Regina Soufli, Franck Delmotte, Jennifer Rebellato, F. Auchère, Sébastien de Rossi, Xueyan Zhang, Evgueni Meltchakov
Publikováno v:
Proc. SPIE
Advances in Optical Thin Films VI
Advances in Optical Thin Films VI, May 2018, Frankfurt, Germany. pp.106911U, ⟨10.1117/12.2313346⟩
Advances in Optical Thin Films VI
Advances in Optical Thin Films VI, May 2018, Frankfurt, Germany. pp.106911U, ⟨10.1117/12.2313346⟩
The thin film optical constants are key parameters to carry out optical simulation or optimization of multilayer mirrors with high efficiency. However, for most materials, different sets of optical constants can be found in the literature especially
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::03c88d4b0ce43faa386d97c6b9553891
https://hal.archives-ouvertes.fr/hal-01831736
https://hal.archives-ouvertes.fr/hal-01831736
Autor:
Evgueni Meltchakov, Sébastien de Rossi, Charles Bourassin-Bouchet, Marc Roulliay, Jennifer Rebellato, Françoise Varniere, Polkovnikov, V. N., Pestov, A., Chkhalo, N., Franck Delmotte
Publikováno v:
XXII International Symposium "Nanophysics and nanoelectronics", Mar 2018, Nizhny Novgorod, Russia. 2018.
XXII International Symposium "Nanophysics and nanoelectronics", Mar 2018, Nizhny Novgorod, Russia. 2018., Mar 2018, Nizhny Novgorod, Russia
HAL
XXII International Symposium "Nanophysics and nanoelectronics", Mar 2018, Nizhny Novgorod, Russia. 2018., Mar 2018, Nizhny Novgorod, Russia
HAL
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4ea84a10917bf769948604222997d50b
https://hal.archives-ouvertes.fr/hal-01840239
https://hal.archives-ouvertes.fr/hal-01840239
Autor:
A. Jérome, Farhad Salmassi, Catherine Burcklen, Julia Meyer-Ilse, Ian Vickridge, Jennifer Rebellato, Franck Delmotte, Regina Soufli, Emrick Briand, Eric M. Gullikson
Publikováno v:
Journal of Applied Physics. 124:035107
In this study, we determine with improved accuracy the complex index of refraction n = 1 − δ + iβ of sputtered chromium thin films for photon energies ranging from 25 eV to 813 eV. These data include the first absolute measurements of the absorpt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::690324ff70283421878ea0107f3849e6
https://doi.org/10.1063/1.5027488
https://doi.org/10.1063/1.5027488