Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Jelena Asari"'
Autor:
Aivar Tarre, Aleks Aidla, Ivan Netšipailo, Peeter Ritslaid, Jaan Aarik, Jelena Asari, Väino Sammelselg, Lauri Aarik
Publikováno v:
Thin Solid Films. 542:219-224
Etching rate of technologically important metal oxide thin films in hot sulphuric acid was investigated. The films of Al-, Ti-, Cr-, and Ta-oxides studied were grown by atomic layer deposition (ALD) method on silicon substrates from different precurs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ba2d68a05bb1c0a7e32405614a1ca940
https://doi.org/10.1016/j.tsf.2013.06.079
https://doi.org/10.1016/j.tsf.2013.06.079
Autor:
Jaana Jürgens, Ivo Leito, Jelena Asari, Olga Volobujeva, Väino Sammelselg, Kristina Virro, Enn Mellikov, Lilli Paama
Publikováno v:
Microchimica Acta. 162:313-323
A case study of ISO GUM-based estimation of measurement uncertainty of quantitative surface elemental analysis is presented. The analytical task was the measurement of iron content in the ink writing on the surface of an 18th century manuscript by el
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dcd5058f3b74c6453dbb64dbcbce2992
https://doi.org/10.1007/s00604-007-0821-0
https://doi.org/10.1007/s00604-007-0821-0
Autor:
Jelena Asari, Väino Sammelselg, Kaupo Kukli, Unto Tapper, Raul Rammula, Jaan Aarik, Esko I. Kauppinen, Marina Lulla
Publikováno v:
Lulla, M, Asari, J, Aarik, J, Kukli, K, Rammula, R, Tapper, U, Kauppinen, E I & Sammelselg, V 2006, ' Electron Probe Microanalysis of HfO 2 Thin Films on Conductive and Insulating Substrates ', Mikrochimica Acta, vol. 155, no. 1-2, pp. 195-198 . https://doi.org/10.1007/s00604-006-0542-9
Quantitative electron probe microanalysis of highly insulating materials is a complicated problem, partially solved by coating samples with grounded thin conductive layers or using novel scanning electron microscopy (SEM) techniques, such as low-volt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ccf5f69ae174578704204a24931fa4ac
https://doi.org/10.1007/s00604-006-0542-9
https://doi.org/10.1007/s00604-006-0542-9
Autor:
Aivar Tarre, Kai Arstila, Arvo Kikas, Eero Rauhala, Jaan Aarik, A. Seppälä, Indrek Martinson, Juhan Karlis, Alex Zakharov, Jelena Asari, Väino Sammelselg
Publikováno v:
Scopus-Elsevier
Titanium oxide and zirconium oxide thin films deposited on silicon substrates were characterised using electron probe microanalysis (EPMA), Rutherford backscattering spectroscopy (RBS), time-of-flight elastic recoil detection analysis (TOF-ERDA) and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f3d45a5b0b6e9e8a728241ee310e7a05
http://www.scopus.com/inward/record.url?eid=2-s2.0-3843069070&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-3843069070&partnerID=MN8TOARS
