Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Jeffrey Yiin"'
Autor:
Zhe Chuan Feng, Dishu Zhao, Lingyu Wan, Weijie Lu, Jeffrey Yiin, Benjamin Klein, Ian T. Ferguson
Publikováno v:
Materials, Vol 15, Iss 24, p 8751 (2022)
Raman scattering spectroscopy (RSS) has the merits of non-destructiveness, fast analysis, and identification of SiC polytype materials. By way of angle-dependent Raman scattering (ADRS), the isotropic characteristics are confirmed for c-face 4H-SiC,
Externí odkaz:
https://doaj.org/article/ce0be4cacd4044089eb4044dd3ca5342
Autor:
Zhe Chuan Feng, Yu-Lun Liu, Jeffrey Yiin, Li-Chyong Chen, Kuei-Hsien Chen, Benjamin Klein, Ian T. Ferguson
Publikováno v:
Materials, Vol 16, Iss 1, p 97 (2022)
GaN nanowires (NWs) grown on silicon via atmospheric pressure chemical vapor deposition were doped with Cobalt (Co) by ion implantation, with a high dose concentration of 4 × 1016 cm−2, corresponding to an average atomic percentage of ~3.85%, and
Externí odkaz:
https://doaj.org/article/7a34ae3bda704338affa1837873adff4
Autor:
Zhe Chuan Feng, Hao-Hsiung Lin, Bin Xin, Shi-Jane Tsai, Vishal Saravade, Jeffrey Yiin, Benjamin Klein, Ian T. Ferguson
Publikováno v:
Vacuum. 207:111643
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13487d8dc91aa533932143302e46a178
https://doi.org/10.1016/j.vacuum.2022.111643
https://doi.org/10.1016/j.vacuum.2022.111643