Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Jeffrey W. Teng"'
Publikováno v:
IEEE Microwave and Wireless Technology Letters. 33:447-450
Autor:
Nelson E. Sepúlveda-Ramos, Jeffrey W. Teng, Adrian Ildefonso, Harrison P. Lee, Sunil G. Rao, John D. Cressler
Publikováno v:
IEEE Transactions on Electron Devices. 70:850-856
Autor:
Delgermaa Nergui, Jeffrey W. Teng, Mozghan Hosseinzadeh, Yaw Mensah, Kan Li, Mariia Gorchichko, Adrian Ildefonso, Brett L. Ringel, En Xia Zhang, Daniel M. Fleetwood, John D. Cressler
Publikováno v:
IEEE Transactions on Nuclear Science. 69:1079-1084
Autor:
Kan Li, Hanbin Ying, En Xia Zhang, Daniel M. Fleetwood, R. Nathan Nowlin, Yaw Mensah, Hari Parameswaran, Delgermaa Nergui, Adrian Ildefonso, Nelson E. Sepulveda-Ramos, Nathaniel A. Dodds, Jeffrey W. Teng, George N. Tzintzarov, Brett Ringel, Mariia Gorchichko, Clifford D. Cheon, John D. Cressler, Sunil G. Rao
Publikováno v:
IEEE Transactions on Nuclear Science. 69:282-289
Autor:
George N. Tzintzarov, Jeffrey W. Teng, Amanda N. Bozovich, Gregory R. Allen, Delgermaa Nergui, Yaw A. Mensah, John D. Cressler
Publikováno v:
IEEE Transactions on Nuclear Science. 69:527-533
Autor:
Dale McMorrow, Jeffrey W. Teng, Jacob P. Kimball, Ani Khachatrian, Adrian Ildefonso, John D. Cressler, Sunil G. Rao, Yaw Mensah, George N. Tzintzarov, Arya Moradinia
Publikováno v:
IEEE Transactions on Nuclear Science. 69:381-389
Publikováno v:
2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
Autor:
Harrison P. Lee, Arya Moradinia, Jeffrey W. Teng, Nelson E. Sepúlveda-Ramos, John D. Cressler
Publikováno v:
2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
Autor:
Adrian Ildefonso, John D. Cressler, En Xia Zhang, Hanbin Ying, Xun Li, Arya Moradinia, Peng Fei Wang, George N. Tzintzarov, Jeffrey W. Teng, Daniel M. Fleetwood
Publikováno v:
IEEE Transactions on Nuclear Science. 68:949-957
Statistical analysis is performed on the totalionizing-dose (TID) response of fourth-generation silicon–germanium heterojunction bipolar transistors, revealing an increasing variance in base current with increasing dose. A 10-fold increase is obser
Autor:
Albert Djikeng, George N. Tzintzarov, Patrick S. Goley, Ani Khachatrian, Stephen P. Buchner, Adrian Ildefonso, Prahlad Iyengar, Joel M. Hales, Ryan Bahr, Dale McMorrow, John D. Cressler, Jeffrey W. Teng, Milad Frounchi
Publikováno v:
IEEE Transactions on Nuclear Science. 68:785-792
Optical single-event transients (OSETs) were measured for the first time in integrated silicon-photonic waveguides. A custom test fixture and novel experimental setup were used at the U.S. Naval Research Laboratory to induce a dense cloud of electron