Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Jeffrey Czarnik"'
Autor:
Edward W. Conder, Roger Ryan Rothhaar, Mark A. LaPack, Jared W. Fennell, Timothy M. Braden, R. Brian Scherer, Jeffrey Czarnik, Jeffrey Thomas Vicenzi, Mark D. Argentine, Jeffrey G. Wei, John Arnold Werner, Robert T. Roginski, Schmid Christopher Randall, Steven E. Dunlap
Publikováno v:
Organic Process Research & Development. 13:131-143
The impact of several new technologies on the development of a manufacturing process for LY518674 is described. Extensive use of process analytical technology (PAT) throughout development, both at laboratory and pilot-plant scale, enabled data-rich e
Autor:
Mark D. Argentine, Timothy M. Braden, Jeffrey Czarnik, Edward W. Conder, Steven E. Dunlap, Jared W. Fennell, Mark A. LaPack, Roger R. Rothhaar, R. Brian Scherer, Christopher R. Schmid, Jeffrey T. Vicenzi, Jeffrey G. Wei, John A. Werner, Robert T. Roginski
Publikováno v:
Organic Process Research & Development; Mar2009, Vol. 13 Issue 2, p131-143, 13p