Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Jeffrey Britt"'
Publikováno v:
ECS Transactions. 98:3-11
High temperature growth of AlN single crystals by physical vapor transport (PVT) was used to produce 2-inch diameter AlN substrates free of macrodefects and with average dislocation densities below 103 cm-2 [1, 2]. In spite of its high structural qua
Autor:
Raoul Schlesser, Hao Yang Fang, Jeffrey Britt, Rafael Dalmau, Balaji Raghothamachar, Michael Dudley
Publikováno v:
Materials Science Forum. 1004:63-68
Large diameter aluminum nitride (AlN) substrates, up to 50 mm, were manufactured from single crystal boules grown by physical vapor transport (PVT). Synchrotron-based x-ray topography (XRT) was used to characterize the density, distribution, and type
Publikováno v:
ECS Meeting Abstracts. :1350-1350
The ultrawide-bandgap (UWBG) AlGaN alloy system is emerging as a promising material for next generation power semiconductor devices. The increase in bandgap as the alloy composition is varied from the binary endpoints GaN to AlN leads to an increase
Autor:
Shanshan Hu, Haoyan Fang, Yafei Liu, Hongyu Peng, Qianyu Cheng, Zeyu Chen, Rafael Dalmau, Jeffrey Britt, Raoul Schlesser, Balaji Raghothamachar, Michael Dudley
Publikováno v:
Journal of Crystal Growth. 584:126548
Autor:
Balaji Raghothamachar, Raoul Schlesser, Rafael Dalmau, Jeffrey Britt, Baxter Moody, Yeon Jae Ji, Jianqiu Guo, Michael Dudley, Elizabeth A. Paisley, H. Spalding Craft
Publikováno v:
Materials Science Forum. 924:923-926
Aluminum nitride (AlN) single crystal boules were grown by physical vapor transport (PVT). Diameter expansion during boule growth, without the introduction of low angle grain boundaries (LAGB) around the boule periphery, was confirmed by crossed pola
Autor:
Haoyan Fang, Hongyu Peng, Zeyu Chen, Qianyu Cheng, Rafael Dalmau, Raoul Schlesser, Jeffrey Britt, Tuerxun Ailihumaer, Yafei Liu, Balaji Raghothamachar, Shanshan Hu, Michael Dudley
Publikováno v:
ECS Meeting Abstracts. :987-987
Publikováno v:
ECS Meeting Abstracts. :986-986
Publikováno v:
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC).
Publikováno v:
ECS Meeting Abstracts. :1368-1368
As development of GaN and SiC material systems for applications in power switching progresses, the ultrawide-bandgap (UWBG) materials, with bandgaps greater than GaN, are gaining increased attention, in pursuit of improved power device performance. S
Autor:
Donnie Starnes, Jeffrey Britton, David Burkholder, Walter Kennebeck, Iffat Suchita, Nicholas Gregg, Bryan Klassen, Brian Lundstrom
Publikováno v:
Brain Stimulation, Vol 14, Iss 6, Pp 1698- (2021)
Externí odkaz:
https://doaj.org/article/2d78bf71cacf4a47a0bc34c1bdea5870