Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Jeffrey B.W. Soon"'
Autor:
Jeffrey B.W. Soon, Gianluca Piazza, Navab Singh, Cristian Cassella, Nicolo Oliva, Merugu Srinivas
Publikováno v:
IEEE Microwave and Wireless Components Letters. 27:105-107
In this work we demonstrate high values of electromechanical coupling coefficient ( $k_{t}^{2}$ ) exceeding 4.9% in 1- $\mu \text {m}$ thick Aluminum Nitride (AlN) two-dimensional-mode resonators (2DMRs) operating around 3.2 GHz. Such a high $k_{t}^{
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 63:331-339
We report Lamb acoustic wave resonators that are suitable for RF applications and that exhibit high power handling at high frequencies above 1 GHz. Resonators use aluminum–nitride as acoustic layer and are fabricated in the Institute of Microelectr
Publikováno v:
2016 IEEE International Ultrasonics Symposium (IUS).
A systematical study is performed to analyze the spurious modes, Q and electromechanical coupling of 1.22 GHz AlN MEMS contour-mode resonators. A total of 135 different geometrical configurations were studied. An unloaded Q of up to 3157, an electrom
Publikováno v:
2016 IEEE 66th Electronic Components and Technology Conference (ECTC).
We report a hermetic thin film packaging on aluminum nitride AlN RF MEMS platforms that is entirely CMOS compatible and wafer level executed. The process flow, including release of multiple free-moving body and encapsulation of the functional structu
Autor:
Jeffrey B.W. Soon, Dim-Lee Kwong, Nan Wang, Fu-Li Hsiao, Chengkuo Lee, Moorthi Palaniapan, Ming Lin Julius Tsai
Publikováno v:
Advanced Materials Research. 254:195-198
Two-dimensional (2-D) Silicon phononic crystal (PnC) slab of a square array of cylindrical air holes in a 10μm thick free-standing silicon plate with line defects is characterized as a cavity-mode PnC resonator. Piezoelectric aluminum nitride (AlN)
Publikováno v:
Advanced Materials Research. 254:74-77
This paper presents an effective evaluation of piezoelectric coefficients (d31 and d33) and other mechanical properties of AlN thin films using resonator structures fabricated on a single wafer. The extracted value for d31 is 1.60pm/V and the d33 val
Publikováno v:
Advanced Materials Research. 254:70-73
Film Bulk Acoustic Wave Resonators (FBAR) at 2.6GHz using AlN piezoelectric material have been fabricated and characterized in this work. A stack of Al bottom electrode, AlN layer and top Al electrode is used to excite the thickness extensional (TE)
Autor:
Kia Hian Lau, Ming Lin Julius Tsai, Tang Min, Lynn Khine, Jeffrey B.W. Soon, Rahul Agarwal, Sanchitha Nirodha Fernando
Publikováno v:
Advanced Materials Research. 254:29-33
This paper presents a novel piezoelectric actuator design that achieves low curling due to residual film stress. The proposed actuator maintains the gap between the movable electrode and the fixed electrode nearly constant independent of the residual
Publikováno v:
2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC).
Through Silicon Via (TSV) provides an alternative solution to the traditional scaling of Moore's Law. Besides the many advantages including reduction in form factor, higher I/O counts and lower power consumption, TSV also enables 3D heterogeneous int
Autor:
Navab Singh, Vittorio Ferrari, Jeffrey B.W. Soon, Srinivas Merugu, Margarita Narducci, Humberto Campanella, Marco Ferrari
This paper presents three MEMS platforms that exhibit multiple thermal sensitivities and multi-frequency capabilities. Multiple sensors with a variety of operating frequencies and thermal sensitivities can co-exist in the same device wafer. Aluminum
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::752d7771f88899fef9ace84e4adc79f9
http://hdl.handle.net/11379/462763
http://hdl.handle.net/11379/462763