Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Jeffrey B. Fortin"'
Publikováno v:
IEEE Sensors Journal. 6:618-622
We present a design, process How, and packaging scheme for a novel three-dimensional capacitive microelectromechanical systems pressure sensor [1], [10]. These sensors present a paradigm shift in pressure sensor technology. They contain an array of v
Autor:
Christopher Kapusta, Aleks Zosuls, Jeffrey B. Fortin, Allyn E. Hubbard, Thomas G. Bifano, David C. Mountain, Howard I. Cohen, Jason William Castle, Fangyi Chen
Publikováno v:
The Journal of the Acoustical Society of America. 119:394-405
The construction, measurement, and modeling of an artificial cochlea (ACochlea) are presented in this paper. An artificial basilar membrane (ABM) was made by depositing discrete Cu beams on a piezomembrane substrate. Rather than two fluid channels, a
Autor:
Jeffrey B. Fortin, Toh-Ming Lu
Chemical Vapor Deposition Polymerization - The Growth and Properties of Parylene Thin Films is intended to be valuable to both users and researchers of parylene thin films. It should be particularly useful for those setting up and characterizing thei
Autor:
Jeffrey B. Fortin, Toh-Ming Lu
Publikováno v:
Thin Solid Films. 397:223-228
The effect of ultraviolet (UV) radiation of λ≥250 nm on the thermal stability, electrical and optical properties of thin poly-para-xylylene (parylene) thin films was studied. Evidence of slight oxidation of the UV treated film was seen using Fouri
Autor:
G.-R. Yang, Jeffrey B. Fortin, Changming Jin, A. Kumar, Toh-Ming Lu, Hassaram Bakhru, W. W. Lee
Publikováno v:
Thin Solid Films. 396:5-8
In this work, we have investigated the thermal stability of the organic component of porous SiO2 (xerogel) films using a combination of ion beam techniques and thermal desorption spectroscopy (TDS). Ion beam techniques reveal a large concentration of
Autor:
Ming Li, Fan Chu, Jeffrey B. Fortin, T. Davenport, Toh-Ming Lu, J.-Y. Kim, G. Fox, Xi-Cheng Zhang
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 7:624-629
Goniometric time-domain spectroscopy (GTDS), employing an ultrashort electromagnetic (EM) pulse technique, has been developed for measuring the dielectric constant of thin films in a broad band of gigahertz to terahertz. An ultrafast optoelectronic s
Publikováno v:
Physical Review Letters. 85:3229-3232
The growth front roughness of linear poly( p-xylylene) films grown by vapor deposition polymerization has been investigated using atomic force microscopy. The interface width w increases as a power law of film thickness d, w approximately d(beta), wi
Autor:
Thomas F. Koetzle, Adina Golombek, Juergen Eckert, Alberto Albinati, Robert H. Morris, Wim T. Klooster, John S. Ricci, Alan J. Lough, Jeffrey B. Fortin, Tina P. Fong
Publikováno v:
Inorganica Chimica Acta. 259:351-357
The structure of the complex trans-[Ru(η2-H2)(H)(dppe)2][BPh4](1),dppe = PPh2CH2CH2PPh2, has been determined by single-crystal X-ray diffraction at 123 K and neutron diffraction at 12 K. The core of the complex has a distorted octahedral geometry ab
Autor:
Anis Zribi, Jeffrey B. Fortin
Publikováno v:
Functional Thin Films and Nanostructures for Sensors
This chapter focuses on introducing fundamental design principles of transducers, familiarizing readers who are new to this field with the common vocabulary used in describing transducer performance, and providing a succinct historical background abo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24bf3474c82c3bea923c255d3727a603
https://doi.org/10.1007/b138612
https://doi.org/10.1007/b138612
Autor:
Jeffrey B. Fortin, Toh-Ming Lu
Publikováno v:
Chemical Vapor Deposition Polymerization ISBN: 9781441954138
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9fc398997606eb8ca8f73bd5e789345b
https://doi.org/10.1007/978-1-4757-3901-5_1
https://doi.org/10.1007/978-1-4757-3901-5_1