Zobrazeno 1 - 10
of 85
pro vyhledávání: '"Jeffrey A Jargon"'
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 70:2743-2749
Publikováno v:
IEEE Microwave Magazine. 23:112-122
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques, 68(11), 4925-4939. Institute of Electrical and Electronics Engineers
IEEE Trans Microw Theory Tech
IEEE Trans Microw Theory Tech
We present a general model of noisy scattering-parameter (S-parameter) measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise is examined to appear like a complex Gaussian quotient. The stati
Publikováno v:
2022 98th ARFTG Microwave Measurement Conference (ARFTG).
Publikováno v:
IEEE Microwave Magazine. 23(5)
Autor:
Jeffrey A. Jargon, Jerome Cheron
Publikováno v:
2021 IEEE Asia-Pacific Microwave Conference (APMC).
Autor:
Xiaohai Cui, Wenze Yuan, Sheng Ding, Xiaomeng Liu, Jinwen Liu, Djamel Allal, Jürgen Rühaak, Karsten Kuhlmann, Yuya Tojima, Moto Kinoshita, Jae-Yong Kwon, Tae-Weon Kang, Vladimir A Perepelkin, Igor P Chirkov, Alexey I Matveev, Daniel Stokes, Aaron M Hagerstrom, Angela C Stelson, Jeffrey A Jargon, Dazhen Gu, Christian J Long, François Ziadé
Publikováno v:
Metrologia. 60:01001
Main text This report summarizes the results of the measurements performed as a CIPM Key Comparison (CCEM.RF-K27.W) on high frequency power in waveguide among eight National Metrology Institutes (NMIs) of Germany (PTB), UK (NPL), France (LNE), China
Publikováno v:
2021 97th ARFTG Microwave Measurement Conference (ARFTG).
Autor:
Paritosh Manurkar, Dylan F. Williams, Kate A. Remley, Robert D. Horansky, Benjamin F. Jamroz, Jeffrey A. Jargon
Publikováno v:
IEEE Trans Microw Theory Tech
As the next-generation communications technology continues to evolve to utilize millimeter-wave frequencies, calibration methods are needed for the nonidealities related to these frequencies in communications electronics. In this article, we demonstr
Autor:
Aaron M. Hagerstrom, Christian J. Long, Dylan F. Williams, Eric S. Stanfield, Wei Ren, Paul D. Hale, Jeffrey A. Jargon, Angela C. Stelson, John R. Stoup
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a920229c47c31c56792eb77cf063d762
https://doi.org/10.6028/nist.tn.2109
https://doi.org/10.6028/nist.tn.2109