Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Jeff H. Baker"'
Publikováno v:
Nano Letters. 3:731-735
Chemical vapor deposition (CVD) of single-walled carbon nanotubes (SWNTs) catalyzed using a few nm thick Ni layer supported by a thin Al underlayer is reported. Analysis by transmission electron mi...
Publikováno v:
Surface and Interface Analysis. 29:179-187
Optical methods are used to determine the thickness of thin metal films, with emphasis on spectroscopic ellipsometry and transmission. We discuss the conditions where this is possible and how to determine the optical constants for the material. The d
Publikováno v:
61st Device Research Conference. Conference Digest (Cat. No.03TH8663).
In this paper, we have studied selective area chemical vapor deposition (CVD) of single-walled carbon nanotubes (SWNTs) on substrates patterened with catalyst films consisting of an ultra-thin transition metal layer supported by an Al under-layer.
Autor:
Todd Bailey, Stephen C. Johnson, Kathleen A. Gehoski, John G. Ekerdt, Sidlgata V. Sreenivasan, William J. Dauksher, Jeff H. Baker, Eric S. Ainley, Byung Jin Choi, C. Grant Willson, Douglas J. Resnick, Kevin J. Nordquist, David P. Mancini
Publikováno v:
Emerging Lithographic Technologies VI.
Step and Flash Imprint Lithography (SFIL) is an attractive method for printing sub-100 nm geometries. Relative to other imprinting processes SFIL has the advantage that the template is transparent, thereby facilitating conventional overlay techniques