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pro vyhledávání: '"Jee, Tae Kwon"'
Autor:
Jee, Tae Kwon
This thesis research focuses on the characterization of thinfilms made of poly(vinylidene fluoride) (PVDF) using an atomic force microscope. Thinfilms of PVDF were fabricated by a spin coating method with different conditions and characterized using
Externí odkaz:
http://hdl.handle.net/1969.1/4790
Autor:
Jee, Tae Kwon
Thesis (M. S.)--Texas A&M University, 2005.
"Major Subject: Mechanical Engineering" Title from author supplied metadata (automated record created on Apr. 27, 2007.) Vita. Abstract. Includes bibliographical references.
"Major Subject: Mechanical Engineering" Title from author supplied metadata (automated record created on Apr. 27, 2007.) Vita. Abstract. Includes bibliographical references.
Externí odkaz:
http://handle.tamu.edu/1969.1/4790
Autor:
Engelmann, Sebastian U., Wise, Rich S., Maslow, Mark J., Timoshkov, Vadim, Kiers, Ton, Jee, Tae Kwon, de Loijer, Peter, Morikita, Shinya, Demand, Marc, Metz, Andrew W., Okada, Soichiro, Kumar, Kaushik A., Biesemans, Serge, Yaegashi, Hidetami, Di Lorenzo, Paolo, Bekaert, Joost P., Mao, Ming, Beral, Christophe, Larivière, Stephane
Publikováno v:
Proceedings of SPIE; April 2017, Vol. 10149 Issue: 1 p101490N-101490N-16, 10047527p
Autor:
Kye, Jongwook, Owa, Soichi, Maslow, Mark John, Timoshkov, Vadim, Kiers, Ton, Jee, Tae Kwon, Reijnen, Liesbeth, Kumar, Kaushik, Demand, Marc, Fonseca, Carlos, Cerbu, Florin, Schelcher, Guillaume, Beral, Christophe
Publikováno v:
Proceedings of SPIE; March 2018, Vol. 10587 Issue: 1 p1058704-1058704-14
Autor:
Hohle, Christoph K., Gronheid, Roel, Yaegashi, Hidetami, Koike, Kyohei, Fonseca, Carlos, Yamashita, Fumiko, Kaushik, Kumar, Morikita, Shinya, Ito, Kiyohito, Yoshimura, Shota, Timoshkov, Vadim, Maslow, Mark, Jee, Tae Kwon, Reijnen, Liesbeth, Choi, Peter, Feng, Mu, Spence, Chris, Schoofs, Stijn
Publikováno v:
Proceedings of SPIE; March 2018, Vol. 10586 Issue: 1 p1058605-1058605-5
Autor:
Gargini, Paolo A., Naulleau, Patrick P., Ronse, Kurt G., Itani, Toshiro, Jee, Tae Kwon, Timoshkov, Vadim, Choi, Peter, Rio, David, Tsai, Yu-Cheng, Yaegashi, Hidetami, Koike, Kyohei, Fonseca, Carlos, Schoofs, Stijn
Publikováno v:
Proceedings of SPIE; October 2017, Vol. 10450 Issue: 1 p1045017-1045017-9