Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Jean-Pierre Borgogno"'
Autor:
Trudy Tuttle-Hart, C. K. Carniglia, Andreas Saxer, Jean-Pierre Borgogno, Gerard Albrand, B. Lazarides, Emile Pelletier, Jean M. Bennett, T. H. Allen, Karl H. Guenther, Reed A. Schmell
Publikováno v:
Applied optics. 28(16)
Fourteen university, government, and industrial laboratories prepared a total of twenty pairs of single-layer titanium dioxide films. Several laboratories analyzed the coatings to determine their optical properties, thickness, surface roughness, abso
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::739ab6b9ff1313e748523d1d23b644d9
https://pubmed.ncbi.nlm.nih.gov/20555696
https://pubmed.ncbi.nlm.nih.gov/20555696
Publikováno v:
Applied optics. 21(22)
The refractive index of a layer is a sensitive function of the preparation conditions. Normal incidence measurement of the optical properties can reveal possible inhomogeneity of index. We propose a method of automatic determination of the complex re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::27a94c4021bf2412a25fc8f923c0faba
https://pubmed.ncbi.nlm.nih.gov/20401002
https://pubmed.ncbi.nlm.nih.gov/20401002
Publikováno v:
Optical Interference Coatings.
The Photothermal Deflection Technique (PD) is used for mapping absorption in optical coatings. We have observed a strong influence ofthe nature ofthe substrate material on measured absorptance. Different single layer films deposited in the same condi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ecad6d3384a1423bd8c647eed74c884a
https://doi.org/10.1117/12.192067
https://doi.org/10.1117/12.192067
Publikováno v:
Optical Interference Coatings.
Photothermal Deflection (PD) is used for mapping very small absorption losses (as low as 10 -6 ). Measurements performed on bare substrates have shown the existence of highly non uniform absorption localized on the substrate surface. High absorption
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f3c8f7f25d95e5ea5bd7353fa8bc9ed
https://doi.org/10.1117/12.192177
https://doi.org/10.1117/12.192177
Autor:
Dominique Endelema, Hervé Rigneault, Jean-Pierre Borgogno, Emmanuel Rausa, Antonella Rizzo, Francois Flory
Publikováno v:
Optical Interference Coatings.
Consequences of the columnar microstructure of dielectric thin films deposited by conventional vacuum evaporation are discussed. A model associated with the columns is used together with in situ and in air measurements to show that the anisotropy of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7cf530c0f39f400342133678f519236
https://doi.org/10.1117/12.192065
https://doi.org/10.1117/12.192065
Publikováno v:
Applied Optics. 34:2372
The surface quality of bare substrates and preparation procedures take on an important role in optical coating performances. The most commonly used techniques of characterization generally give information about roughness and local defects. A phototh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ebc1e3e64880fa04f3f617d6faa318b0
https://doi.org/10.1364/ao.34.002372
https://doi.org/10.1364/ao.34.002372
Publikováno v:
Thin Solid Films. 102:209-220
The determination of the extinction coefficient of a material deposited in thin film form is generally made from Wolter's formula using (R − R′) T . To avoid the measurement of R ′, we have derived an analogous formula involving only R and T in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ae88acfb003270a71174b35deff796c
https://doi.org/10.1016/0040-6090(83)90088-3
https://doi.org/10.1016/0040-6090(83)90088-3
Publikováno v:
Thin Solid Films. 146:145-154
Resume Les materiaux evapores par les methodes classiques donnent souvent des couches inhomogenes. Il est admis depuis longtemps que le modele classique de la couche homogene, isotrope, a faces planes et paralleles ne rend pas correctement compte des
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f4cf4029150033b64873459ea2bb5061
https://doi.org/10.1016/0040-6090(87)90216-1
https://doi.org/10.1016/0040-6090(87)90216-1
Autor:
Emile Pelletier, Jean-Pierre Borgogno
Publikováno v:
Applied Optics. 28:2895
Data obtained from reflectance and transmittance measurements are used to determine the extinction coefficient. We show that accuracy is limited by the substrate quality and interface roughnesses of the layer.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::136a53d75fb2df986328708aa56e81a6
https://doi.org/10.1364/ao.28.002895
https://doi.org/10.1364/ao.28.002895
Autor:
C. K. Carniglia, Tracy F. Thonn, V. A. Hodgkin, T. Tuttle Hart, Jean-Pierre Borgogno, D. M. Quinn, R. M. Swenson, Emile Pelletier, Ursula J. Gibson, J. A. Dobrowolski, P. A. Temple, Jean M. Bennett, F. C. Ho, Martin Purvis, W. P. Klapp, D. P. Arndt, R. M. A. Azzam, H. A. Macleod, W. E. Case, D. H. Strome
Publikováno v:
Applied Optics. 23:3571
The seven participating laboratories received films of two different thicknesses of Sc2O3 and Rh. All samples of each material were prepared in a single deposition run. Brief descriptions are given of the various methods used for determination of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::66f2117ab8377ff65874e9c5ac67b26e
https://doi.org/10.1364/ao.23.003571
https://doi.org/10.1364/ao.23.003571