Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Jean-Marc Blaquiere"'
Autor:
Didier Flumian, Sebastien Sanchez, Andrea Verdicchio, Herve Caron, Joseph Fabre, Philippe Ladoux, Jean-Marc Blaquiere
Publikováno v:
IEEE Transactions on Transportation Electrification
IEEE Transactions on Transportation Electrification, Institute of Electrical and Electronics Engineers, 2021, IEEE Transactions on Transportation Electrification, 7 (2), pp.854-869. ⟨10.1109/TTE.2020.3033659⟩
IEEE Transactions on Transportation Electrification, Institute of Electrical and Electronics Engineers, 2021, IEEE Transactions on Transportation Electrification, 7 (2), pp.854-869. ⟨10.1109/TTE.2020.3033659⟩
International audience; Today, in Electric Railways, the old DC supply systems are reaching their limits. To improve their efficiency and increase railroad traffic, a new DC Electrification has recently been proposed at 9-kV. It is now necessary to p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::edb4fb44e6527804e3f9b9c3b9668c7f
https://doi.org/10.1109/tte.2020.3033659
https://doi.org/10.1109/tte.2020.3033659
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2021, pp.114246. ⟨10.1016/j.microrel.2021.114246⟩
32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021
32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, Oct 2021, Bordeaux, France
Microelectronics Reliability, Elsevier, 2021, pp.114246. ⟨10.1016/j.microrel.2021.114246⟩
32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021
32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, Oct 2021, Bordeaux, France
International audience; This paper focuses on the extensive robustness validation of a gate charge detection method designed for SiC MOSFETs under short-circuit operation, and, in terms of failure-modes. The benefits of having a fast (submicrosecond-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f6dd28a8f85e4e675bcd3d0e864045b3
https://hal.archives-ouvertes.fr/hal-03381405/document
https://hal.archives-ouvertes.fr/hal-03381405/document
Publikováno v:
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe), Sep 2020, Lyon (Virtual ), France. pp.P.1-P.10, ⟨10.23919/EPE20ECCEEurope43536.2020.9215619⟩
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe), Sep 2020, Lyon (Virtual ), France. pp.P.1-P.10, ⟨10.23919/EPE20ECCEEurope43536.2020.9215619⟩
SiC MOSFETs have a low short circuit withstand time. To address this challenge, a soft shut down and two original detection methods are proposed in this paper, easily implemented and based-on (ig, vgs) diagnosis with no direct time dependency. The fi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8310c70bea43006a41c2d300e64cf68e
https://hal.archives-ouvertes.fr/hal-02980827/document
https://hal.archives-ouvertes.fr/hal-02980827/document
Autor:
François Boige, Stéphane Lefebvre, Abdelhakim Bourennane, Jean-Marc Blaquiere, Frédéric Richardeau, Gerard Guibaud
Publikováno v:
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 )
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 ), Oct 2018, Aalborg, Denmark. pp.598-603, ⟨10.1016/j.microrel.2018.07.026⟩
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2018, 88-90, pp.598-603. ⟨10.1016/j.microrel.2018.07.026⟩
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 )
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 ), Oct 2018, Aalborg, Denmark. pp.598-603, ⟨10.1016/j.microrel.2018.07.026⟩
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2018, 88-90, pp.598-603. ⟨10.1016/j.microrel.2018.07.026⟩
International audience; The purpose of this paper is to present a complete experimentation of the two failure modes in competition that can appear during short-circuit (SC) fault operation of single-chip 1,2kV SiC MOSFETs from different manufacturers
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::016d1d4385282b2398d8103e93d9ae3f
https://hal.science/hal-02180574/document
https://hal.science/hal-02180574/document
Publikováno v:
IEEE Transactions on Industry Applications
IEEE Transactions on Industry Applications, Institute of Electrical and Electronics Engineers, 2017, 53 (6), pp.5820-5830. ⟨10.1109/TIA.2017.2747498⟩
IEEE Transactions on Industry Applications, Institute of Electrical and Electronics Engineers, 2017, 53 (6), pp.5820-5830. ⟨10.1109/TIA.2017.2747498⟩
International audience; Currently, in electric railways, the old dc supply systems are reaching their limits. In several European railway networks, due to the line-voltage drops between substations, there are several sectors where traffic can no long
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7c78cd6009dea5afa1120d829962bea9
https://hal.archives-ouvertes.fr/hal-02273694
https://hal.archives-ouvertes.fr/hal-02273694
Autor:
Ilhem Slama-Belkhodja, Frédéric Richardeau, Hafedh Ben Abdelghani, Franck Mosser, Jean-Marc Blaquiere, Afef Bennani-Ben Abdelghani
Publikováno v:
IEEE Transactions on Industrial Electronics
IEEE Transactions on Industrial Electronics, Institute of Electrical and Electronics Engineers, 2017, 64 (8), pp.6453-6464. ⟨10.1109/TIE.2017.2682009⟩
IEEE Transactions on Industrial Electronics, Institute of Electrical and Electronics Engineers, 2017, 64 (8), pp.6453-6464. ⟨10.1109/TIE.2017.2682009⟩
This paper deals with a hybrid fault-tolerant converter topology. It is performed through the connection of a classical three-phase three-level neutral-point-clamped (3L-NPC) converter with a fourth three-level flying capacitor (3L-FC) leg. The 3L-FC
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4c2114cf25fc8c2ce643e62208685c69
https://hal.archives-ouvertes.fr/hal-02920315/document
https://hal.archives-ouvertes.fr/hal-02920315/document
Autor:
Zhifeng Dou, Emmanuel sarraute, Frédéric Richardeau, Vincent Bley, Jean-Marc Blaquiere, Claire Vella, Gilles Gonthier
Publikováno v:
European Journal of Electrical Engineering. 16:409-424
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::392d3a2a90f5ed0a888496b9c3835913
https://doi.org/10.3166/ejee.16.409-424
https://doi.org/10.3166/ejee.16.409-424
Autor:
Franck Mosser, Ilhem Slama-Belkhodja, Jean-Marc Blaquiere, Afef Bennani-Ben Abdelghani, Frédéric Richardeau, Hafedh Ben Abdelghani
Publikováno v:
IET Power Electronics
IET Power Electronics, The Institution of Engineering and Technology, 2016, 9 (12), pp.2350-2359. ⟨10.1049/iet-pel.2015.0785⟩
IET Power Electronics, The Institution of Engineering and Technology, 2016, 9 (12), pp.2350-2359. ⟨10.1049/iet-pel.2015.0785⟩
This study details a three-level hybrid fault-tolerant converter. The definition of an original decoupling solution between the fourth flying capacitor (FC) leg and the three neutral point (NP) clamped-based phases overcomes topology hybridisation is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::12c1c2ef3fae5928843289cc5dfaf273
https://hal.archives-ouvertes.fr/hal-02920304/document
https://hal.archives-ouvertes.fr/hal-02920304/document
Publikováno v:
ESARS 2016 International Conference on Electrical Systems for Aircraft, Railway, Ship Propulsion and Road Vehicles & International Transportation Electrification Conference (ESARS-ITEC)
ESARS 2016 International Conference on Electrical Systems for Aircraft, Railway, Ship Propulsion and Road Vehicles & International Transportation Electrification Conference (ESARS-ITEC), Nov 2016, Toulouse, France. pp.1-7, ⟨10.1109/ESARS-ITEC.2016.7841371⟩
ESARS 2016 International Conference on Electrical Systems for Aircraft, Railway, Ship Propulsion and Road Vehicles & International Transportation Electrification Conference (ESARS-ITEC), Nov 2016, Toulouse, France. pp.1-7, ⟨10.1109/ESARS-ITEC.2016.7841371⟩
International audience; Currently, former DC supply systems reach their limits. In several European Railway networks, there are several sectors where it is not possible to operate locomotives at their nominal ratings or to increase traffic. Indeed, t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::164251ef7ad2f90e22cb8b9a410ab439
https://hal.science/hal-03902993
https://hal.science/hal-03902993
Autor:
Frédéric Richardeau, Jean-Marc Blaquiere, Emmanuel Sarraute, Claire Vella, Vincent Bley, Gilles Gonthier, Zhifeng Dou
Publikováno v:
Microelectronics Reliability. 52:2457-2464
In this article a generic and passive dual-switch fuse is designed to symmetrically disconnect a switching cell against a leg short circuit failure. A compact FR4 copper tracks – PCB structure is proposed combining a dual-fuse mode and a passive du
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::73075d2df942464c6319f4a2680fb4c3
https://doi.org/10.1016/j.microrel.2012.06.082
https://doi.org/10.1016/j.microrel.2012.06.082