Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Jean-Luc Rouviere"'
Autor:
Tuan M. Duong, Kshipra Sharma, Fabio Agnese, Jean-Luc Rouviere, Hanako Okuno, Stéphanie Pouget, Peter Reiss, Wai Li Ling
Publikováno v:
Frontiers in Chemistry, Vol 10 (2022)
In-depth and reliable characterization of advanced nanoparticles is crucial for revealing the origin of their unique features and for designing novel functional materials with tailored properties. Due to their small size, characterization beyond nano
Externí odkaz:
https://doaj.org/article/47b5d2c23605494888e5537283a7ba71
Autor:
Bruno César da Silva, Zahra Sadre Momtaz, Eva Monroy, Hanako Okuno, Jean-Luc Rouviere, David Cooper, Martien Ilse Den Hertog
Publikováno v:
Nano Letters
Nano Letters, 2022, 22 (23), pp.9544-9550. ⟨10.1021/acs.nanolett.2c03684⟩
Nano Letters, 2022, 22 (23), pp.9544-9550. ⟨10.1021/acs.nanolett.2c03684⟩
A key issue in the development of high-performance semiconductor devices is the ability to properly measure active dopants at the nanometer scale. 4D scanning transmission electron microscopy and off-axis electron holography have opened up the possib
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::97a3e06bdf7245dc812baa93f710e37f
https://hal.science/hal-03881003/document
https://hal.science/hal-03881003/document
Autor:
Benedikt Haas, Robert Mcleod, Thomas Auzelle, Bruno Daudin, Eymery, J., FREDERIC LANCON, Jian-Min Zou, Jean-Luc Rouviere
Publikováno v:
Wiley-VCH Verlag GmbH & Co. KGaA, 2016
HAL
HAL
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::dc4a9d49089fd4e6d9aa7193d9473132
https://hal.archives-ouvertes.fr/hal-02143427
https://hal.archives-ouvertes.fr/hal-02143427
Autor:
Fabio Agnese, Aurelie Lefrançois, Stephanie Pouget, Louis Vaure, Ourania Makrygenni, Fréderic Chandezon, Pascale Bayle-Guillemaud, Hanako Okuno, Peter Reiss, Jean-Luc Rouviere
Publikováno v:
European Microscopy Congress 2016
European Microscopy Congress 2016, Aug 2016, Lyon, France. ⟨10.1002/9783527808465.EMC2016.5986⟩
European Microscopy Congress 2016, Aug 2016, Lyon, France. ⟨10.1002/9783527808465.EMC2016.5986⟩
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::760318452cc05ae7e3a6f5fe854d5052
https://hal.univ-grenoble-alpes.fr/hal-03805183
https://hal.univ-grenoble-alpes.fr/hal-03805183
Autor:
Shay Reboh, Rémi Coquand, Nicolas Loubet, Nicolas Bernier, Robin Chao, Guillaume Audoit, Jean-Luc Rouviere, Sylvain Barraud, Emmanuel Augendre, Juntao Li, Raja Muthinti, John Gaudiello, Narciso Gambacorti, Tenko Yamashita, Olivier Faynot
Publikováno v:
ECS Meeting Abstracts. :1370-1370
In recent years there was a major structural transition from planar 2D to 3D FinFETs in Si-technology of transistors providing improvement of electrical characteristics for advanced devices. A further evolution to stacked gate-all-around channels (SG
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0112f069c856aec8d30c841470533c5a
https://doi.org/10.1149/ma2018-01/22/1370
https://doi.org/10.1149/ma2018-01/22/1370
Autor:
Martien I. den Hertog, Jean-Luc. Rouviere, Florian Dhalluin, Pierre J. Desré, Pascal Gentile, Pierre Ferret, Fabrice Oehler, Thiery Baron
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540852254
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c976fc7f5c5bcac1d88edcabd85efdc3
https://doi.org/10.1007/978-3-540-85226-1_63
https://doi.org/10.1007/978-3-540-85226-1_63
Autor:
Thierry Baron, Bassem Salem, Florian Dhalluin, Marie Panabiere, Martien Den Hertog, Jean-Luc Rouviere, Pierre Ferret, Nicolas Pauc, Pascal Gentile
Publikováno v:
ECS Meeting Abstracts. :1196-1196
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e3fd0d80bf6e8f1929b39ba992ce109b
https://doi.org/10.1149/ma2007-02/22/1196
https://doi.org/10.1149/ma2007-02/22/1196