Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Jean-Christophe Peffen"'
Publikováno v:
Advances in X-Ray/EUV Optics and Components XVII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5df7f0af1535ca31458b937f7fd63b73
https://doi.org/10.1117/12.2632702
https://doi.org/10.1117/12.2632702
Autor:
Christian Morawe, François Perrin, Raymond Barrett, Sylvain Labouré, A. Vivo, Jean Christophe Peffen
Publikováno v:
Journal of Synchrotron Radiation. 26:1872-1878
The surface figure error of a hard X-ray mirror was improved by combining differential deposition and off-line metrology tools. Thin Cr layers were deposited on flat substrates by DC magnetron sputtering. The substrates were moved in front of a beam-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c93049e5dfec907a4eff578c5978220e
https://doi.org/10.1107/s1600577519012256
https://doi.org/10.1107/s1600577519012256
Autor:
François Perrin, Sylvain Labouré, A. Vivo, Jean-Christophe Peffen, Raymond Barrett, Christian Morawe
Publikováno v:
Advances in X-Ray/EUV Optics and Components XIV.
Differential deposition techniques were applied to reduce the figure error of x-ray mirrors. Cr layers were sputtered on flat substrates that were moved with variable speed in front of a beam defining aperture. The required velocity profile was calcu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5318176fe932f8a9f352cc0dab7d04c7
https://doi.org/10.1117/12.2528750
https://doi.org/10.1117/12.2528750
Autor:
Nichada Jearanaikoon, Surachet Rattanasuporn, Christian Morawe, Jean-Christophe Peffen, Ratchadaporn Supruangnet, Hideki Nakajima, Wutthikri Busayaporn, Pat Photongkam
Publikováno v:
Applied Surface Science. 367:347-353
Chemical modifications of B 4 C cap layers on sputtered Pd/B 4 C multilayer coatings for X-ray optical applications were investigated using X-ray reflectivity, photoemission electron spectroscopy, photoemission electron microscopy, transmission elect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c55fbcaf5b9af758fbb06b160b593f99
https://doi.org/10.1016/j.apsusc.2016.01.180
https://doi.org/10.1016/j.apsusc.2016.01.180
Autor:
Christian Morawe, Jean-Christophe Peffen, Narong Chanlek, Ratchadaporn Supruangnet, Phakkhananan Pakawanit, Dechmongkhon Kaewsuwan, Sylvain Labouré
Publikováno v:
Applied Surface Science. 509:144920
In the context of multilayer based X-ray optics developments, thin layered systems of C/[Pt/B4C] multilayers and C/Pt/B4C/Cr stacks with variable cap layer thicknesses were deposited on Si wafers using DC magnetron sputtering. The samples were studie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4092091bd5c09593232a7d86ffbe6c9f
https://doi.org/10.1016/j.apsusc.2019.144920
https://doi.org/10.1016/j.apsusc.2019.144920
Publikováno v:
Advances in X-Ray/EUV Optics and Components XII.
The ESRF Multilayers Laboratory provides reflective optics in the X-ray domain using a deposition system where silicon substrates are coated with a well-defined multilayers stack. The multilayers period is used to tune the photon energy of the reflec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7cd006219bc61feb1a9d9e6cb04655a6
https://doi.org/10.1117/12.2273273
https://doi.org/10.1117/12.2273273
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 493:189-198
We present first experimental results on the fabrication and characterization of depth-graded X-ray multilayers providing a broad and well-defined reflectivity profile. Following a theoretical approach including analytical and numerical techniques we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f871391b3847b9e72720b75c55f7987
https://doi.org/10.1016/s0168-9002(02)01570-x
https://doi.org/10.1016/s0168-9002(02)01570-x
Autor:
Jean-Christophe Peffen, F. Yakhou-Harris, N. B. Brookes, Lucio Braicovich, Giacomo Claudio Ghiringhelli, Christian Morawe, Ratchadaporn Supruangnet
Publikováno v:
SPIE Proceedings.
On the upgraded ESRF soft x-ray beamline ID32 a new spectrometer for Resonant X-ray Inelastic Scattering (RIXS) will be installed. To operate in fully polarized mode, a polarimeter will be inserted in the instrument to measure simultaneously the ener
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a0e91521a4c8f999972297376dbf15f4
https://doi.org/10.1117/12.2061827
https://doi.org/10.1117/12.2061827
Publikováno v:
SPIE Proceedings.
Under synchrotron radiation white beam exposure, strong mechanical stress can build up in multilayer optics, caused by the thermal mismatch between layer material and substrate material. To study the stability and performance of multilayer optics und
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5be62380280922d800c765b4930f8df3
https://doi.org/10.1117/12.2059583
https://doi.org/10.1117/12.2059583
Publikováno v:
SPIE Proceedings.
Periodic multilayers exposed to a non-destructive annealing sequence have shown reversible and irreversible structural modifications. In-situ x-ray reflectometry experiments at the ESRF bending magnet beam line BM5 demonstrate that the overall period
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::43cda4dc8a3e1ae16643b5fd85abed54
https://doi.org/10.1117/12.678472
https://doi.org/10.1117/12.678472