The Surface Wave Scattering – Microwave Scanner (SWS-MS)

Autor: Bernard Lacroix, Jean Sébastien Bailly, Hervé Tortel, Maha Chamtouri, Olivier Merchiers, Rodolphe Vaillon, Amelie Litman, Mathieu Francoeur, Jean-Michel Geffrin

Publikováno v: Journal of Quantitative Spectroscopy and Radiative Transfer
Journal of Quantitative Spectroscopy and Radiative Transfer, Elsevier, 2016, 168, pp. 1-9. ⟨10.1016/j.jqsrt.2015.08.019⟩
Journal of Quantitative Spectroscopy and Radiative Transfer, 2016, 168, pp. 1-9. ⟨10.1016/j.jqsrt.2015.08.019⟩

International audience; The Surface Wave Scattering-Microwave Scanner (SWS-MS) is a device that allows the measurement of the electromagnetic fields scattered by objects totally or partially submerged in surface waves. No probe is used to illuminate

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ac9977109421cf0d56bc1e579bcd49f7
https://hal.archives-ouvertes.fr/hal-01281203