Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Jean Philippe Aguerre"'
Autor:
Jon Altube, Inaki Legarda-Ereno, Jean-Philippe Aguerre, Nestor Arana-Arexolaleiba, Aitor Apraiz, Julen Balzategui, Luka Eciolaza
Publikováno v:
ETFA
Balzategui, J, Eciolaza, L, Arana-Arexolaleiba, N, Altube, J, Aguerre, J P, Legarda-Ereño, I & Apraiz, A 2019, Semi-automatic quality inspection of solar cell based on Convolutional Neural Networks . in Proceedings-2019 24th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2019 ., 8869359, IEEE Signal Processing Society, IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, vol. 2019-September, pp. 529-535, 24th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2019, Zaragoza, Spain, 10/09/2019 . https://doi.org/10.1109/ETFA.2019.8869359
Balzategui, J, Eciolaza, L, Arana-Arexolaleiba, N, Altube, J, Aguerre, J P, Legarda-Ereño, I & Apraiz, A 2019, Semi-automatic quality inspection of solar cell based on Convolutional Neural Networks . in Proceedings-2019 24th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2019 ., 8869359, IEEE Signal Processing Society, IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, vol. 2019-September, pp. 529-535, 24th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2019, Zaragoza, Spain, 10/09/2019 . https://doi.org/10.1109/ETFA.2019.8869359
Quality control of solar cells is a very important part of the production process. A little crack or joint failure can cause bad performance of the cell in the future, partly because the defective areas can be electrically disconnected from the activ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2112062e7e3dca4c87e8f9d85a12bff2
https://doi.org/10.1109/etfa.2019.8869359
https://doi.org/10.1109/etfa.2019.8869359
Autor:
Stéphane Dessors, Christen H. Nielsen, Wolfgang Wittner, Tobias Mueller, Nathan Miller, Alejandro Várez, Matteo Calaon, Jean Philippe Aguerre, Steffen Scholz, Sabino Azcarate, Joseba Esmoris, Alberto Cervera, Martin Philipp-Pichler, Christophe Edouard, Stefan Simeonov Dimov, Guido Tosello, Thomas Wilfinger, Gorka Aguirre, Manfred Prantl
Publikováno v:
4M/IWMF2016 The Global Conference on Micro Manufacture : Incorporating the 11th International Conference on Multi-Material Micro Manufacture (4M) and the 10th International Workshop on Microfactories (IWMF).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d0e6c5d497d558c7be165dff5d24ba4
https://doi.org/10.3850/978-981-11-0749-8_hinmico
https://doi.org/10.3850/978-981-11-0749-8_hinmico