Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Jean Luc Diot"'
Autor:
Jean-Marc Heintz, Emilien Feuillet, Jean-François Silvain, Loic Constantin, S. Bordère, Lionel Teule-Gay, Jean Luc Diot, Yongfeng Lu, Renaud de Langlade
Publikováno v:
ACS Applied Electronic Materials
ACS Applied Electronic Materials, American Chemical Society, 2021, 3 (2), pp.921-928. ⟨10.1021/acsaelm.0c01040⟩
ACS Applied Electronic Materials, American Chemical Society, 2021, 3 (2), pp.921-928. ⟨10.1021/acsaelm.0c01040⟩
International audience; Developing solder joints capable of withstanding high power density, high temperature, and significant thermomechanical stress is essential to further develop electronic device performances. This study demonstrates an effectiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1c15bf86bce26a504bff733f822e1ae6
http://hdl.handle.net/20.500.12278/109614
http://hdl.handle.net/20.500.12278/109614
Publikováno v:
Metallurgical and Materials Transactions B
Metallurgical and Materials Transactions B, Springer Verlag, 2018, 49 (6), pp.3343-3356. ⟨10.1007/s11663-018-1391-8⟩
Metallurgical and Materials Transactions B, Springer Verlag, 2018, 49 (6), pp.3343-3356. ⟨10.1007/s11663-018-1391-8⟩
International audience; Transient Liquid Phase (TPL) bounding of Sn foil sandwiched between two Cu foils involves, in the temperature range above the melting point of Sn (232 °C) and below 350 °C, the formation and the growth of two intermetallic c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c9e436338b094b49ab57f5da1bcfab0c
http://hdl.handle.net/20.500.12278/16103
http://hdl.handle.net/20.500.12278/16103
Autor:
Jean-Luc Diot
Publikováno v:
Électronique.
Le packaging a pour role d’etablir les interconnexions electriques, de permettre la protection de la puce microelectronique, la dissipation de chaleur et de garantir la fiabilite du composant. Cet article est entierement consacre au packaging des c
Autor:
Yves Ousten, Vincent Gaud, Isabelle Bord-Majek, Walide Chenniki, Mélanie Louarn, Komkrisd Wongtimnoi, Jean-Luc Diot
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2015, 55 (Issue 12-Part B), pp.2793-2798. ⟨10.1016/j.microrel.2015.06.057⟩
Microelectronics Reliability, Elsevier, 2015, 55 (Issue 12-Part B), pp.2793-2798. ⟨10.1016/j.microrel.2015.06.057⟩
International audience; Thermoplastic resins, such as Liquid Crystal Polymers (LCPs), have many attractive properties for microelectronic cavity package manufacturing (in particular low gas permeation and low dielectric constant). In order to reduce
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1221f19993e265de51fe26c644b4f24e
https://hal.archives-ouvertes.fr/hal-01255459
https://hal.archives-ouvertes.fr/hal-01255459
Autor:
Walide Chenniki, BORD MAJEK Isabelle, Mélanie Louarn, Vincent Gaud, Jean-Luc Diot, Komkrisd Wongtimnoi, Brunel, R., Yves Ousten
Publikováno v:
Fourth International Conference on Multifunctional, Hybrid and Nanomaterials (Hybrid Materials 2015)
Fourth International Conference on Multifunctional, Hybrid and Nanomaterials (Hybrid Materials 2015), Mar 2015, Sitges, Spain
HAL
Fourth International Conference on Multifunctional, Hybrid and Nanomaterials (Hybrid Materials 2015), Mar 2015, Sitges, Spain
HAL
International audience; The development of a new generation of innovative thermoplastics for microelectronic and photonic applications is essential to make cavity packages able to compete with ceramic packages in terms of cost and design flexibility.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::bab24987fdd2abd45f9225d2cc4d2de5
https://hal.archives-ouvertes.fr/hal-01188923
https://hal.archives-ouvertes.fr/hal-01188923
Autor:
Walide Chenniki, BORD MAJEK Isabelle, Mélanie Louarn, Vincent Gaud, Jean-Luc Diot, Bruno Levrier, Virginie Verriere, Thomas Frank, Komkrisd Wongtimnoi, Yves Ousten
Publikováno v:
Proceedings EMPC 2013
EMPC 2013 European Microelectronics Packaging Conference
EMPC 2013 European Microelectronics Packaging Conference, Sep 2013, Grenoble, France. pp.WA3-Chenniki
HAL
EMPC 2013 European Microelectronics Packaging Conference
EMPC 2013 European Microelectronics Packaging Conference, Sep 2013, Grenoble, France. pp.WA3-Chenniki
HAL
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::9f7d3f4b07608b6d7b6d1cc4bcb5c0e1
https://hal.archives-ouvertes.fr/hal-00934255
https://hal.archives-ouvertes.fr/hal-00934255
Autor:
Pierre-Yves Manach, Tudor Balan, Francis Adzima, Sébastien Toutain, Laurent Tabourot, Jean-Luc Diot
Publikováno v:
Journal of Physics: Conference Series
Journal of Physics: Conference Series, IOP Publishing, 2016, 734, pp.032069. ⟨10.1088/1742-6596/734/3/032069⟩
Journal of Physics: Conference Series, IOP Publishing, 2016, 734, pp.032069. ⟨10.1088/1742-6596/734/3/032069⟩
International audience; Micro-forming of ultra-thin sheet metals raises numerous challenges. In this investigation, the predictions of state-of-the-art crystal plasticity (CP) and phenomenological models are compared in the framework of industrial be
Autor:
Walide Chenniki, BORD MAJEK Isabelle, Jean-Luc Diot, Bruno Levrier, Yves Ousten, Eddy Romain-Latu, Virginie Verriere, Julien Vittu
Publikováno v:
HAL
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::82dfead11fbac51bc04a58626fc0226b
https://hal.archives-ouvertes.fr/hal-00714005
https://hal.archives-ouvertes.fr/hal-00714005
Publikováno v:
52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).
Board level solder joint reliability is a critical issue for Quad Flat Non-lead Package (QFN), a type of leadframe CSP, during the thermal cycling test. However, currently there are very few papers available on fatigue modeling and thermal cycling te
Conference
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