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pro vyhledávání: '"Javier Lopez-Miras"'
Autor:
Jesus Gerardo Guerrero-Felix, Javier Lopez-Miras, Miguel Angel Rodriguez-Valverde, Carmen Lucia Moraila-Martinez, Miguel Angel Fernandez-Rodriguez
Publikováno v:
HardwareX, Vol 15, Iss , Pp e00447- (2023)
The Atomic Force Microscopy is a very versatile technique that allows to characterize surfaces by acquiring topographies with sub-nanometer resolution. This technique often overcomes the problems and capabilities of electron microscopy when character
Externí odkaz:
https://doaj.org/article/dc503b5d354248588d452ce5657e708b
