Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Javid UA"'
Autor:
Ling J; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA., Gao Z; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA., Xue S; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA., Hu Q; Institute of Optics, University of Rochester, Rochester, NY, USA., Li M; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA., Zhang K; Institute of Optics, University of Rochester, Rochester, NY, USA., Javid UA; Institute of Optics, University of Rochester, Rochester, NY, USA., Lopez-Rios R; Institute of Optics, University of Rochester, Rochester, NY, USA., Staffa J; Institute of Optics, University of Rochester, Rochester, NY, USA., Lin Q; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA. qiang.lin@rochester.edu.; Institute of Optics, University of Rochester, Rochester, NY, USA. qiang.lin@rochester.edu.
Publikováno v:
Nature communications [Nat Commun] 2024 May 17; Vol. 15 (1), pp. 4192. Date of Electronic Publication: 2024 May 17.
Autor:
Moille G; Joint Quantum Institute, NIST/University of Maryland, College Park, MD, USA. gregory.moille@nist.gov.; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, MD, USA. gregory.moille@nist.gov., Stone J; Joint Quantum Institute, NIST/University of Maryland, College Park, MD, USA.; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, MD, USA., Chojnacky M; Joint Quantum Institute, NIST/University of Maryland, College Park, MD, USA.; Sensor Science Division, National Institute of Standards and Technology, Gaithersburg, MD, USA., Shrestha R; Joint Quantum Institute, NIST/University of Maryland, College Park, MD, USA., Javid UA; Joint Quantum Institute, NIST/University of Maryland, College Park, MD, USA.; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, MD, USA., Menyuk C; University of Maryland at Baltimore County, Baltimore, MD, USA., Srinivasan K; Joint Quantum Institute, NIST/University of Maryland, College Park, MD, USA. kartik.srinivasan@nist.gov.; Microsystems and Nanotechnology Division, National Institute of Standards and Technology, Gaithersburg, MD, USA. kartik.srinivasan@nist.gov.
Publikováno v:
Nature [Nature] 2023 Dec; Vol. 624 (7991), pp. 267-274. Date of Electronic Publication: 2023 Dec 13.
Autor:
He Y; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., Lopez-Rios R; Institute of Optics, University of Rochester, Rochester, NY, 14627, USA., Javid UA; Institute of Optics, University of Rochester, Rochester, NY, 14627, USA., Ling J; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., Li M; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., Xue S; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., Vahala K; T.J. Watson Laboratory of Applied Physics, California Institute of Technology, Pasadena, California, 91125, USA., Lin Q; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA. qiang.lin@rochester.edu.; Institute of Optics, University of Rochester, Rochester, NY, 14627, USA. qiang.lin@rochester.edu.
Publikováno v:
Nature communications [Nat Commun] 2023 Jun 12; Vol. 14 (1), pp. 3467. Date of Electronic Publication: 2023 Jun 12.
Autor:
Lu X; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA., Sun Y; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA., Chanana A; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Javid UA; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA., Davanco M; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Srinivasan K; Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.; Joint Quantum Institute, NIST/University of Maryland, College Park, Maryland 20742, USA.
Publikováno v:
Photonics research [Photonics Res] 2023; Vol. 11 (11).
Autor:
Li M; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., Chang L; Department of Electrical and Computer Engineering, University of California Santa Barbara, Santa Barbara, CA, 93106, USA., Wu L; T. J. Watson Laboratory of Applied Physics, California Institute of Technology, Pasadena, CA, 91125, USA., Staffa J; Institute of Optics, University of Rochester, Rochester, NY, 14627, USA., Ling J; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., Javid UA; Institute of Optics, University of Rochester, Rochester, NY, 14627, USA., Xue S; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., He Y; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., Lopez-Rios R; Institute of Optics, University of Rochester, Rochester, NY, 14627, USA., Morin TJ; Department of Electrical and Computer Engineering, University of California Santa Barbara, Santa Barbara, CA, 93106, USA., Wang H; T. J. Watson Laboratory of Applied Physics, California Institute of Technology, Pasadena, CA, 91125, USA., Shen B; T. J. Watson Laboratory of Applied Physics, California Institute of Technology, Pasadena, CA, 91125, USA., Zeng S; Department of Electrical and Computer Engineering, Center for Optical Materials Science and Engineering Technologies, Clemson University, Clemson, SC, 29634, USA., Zhu L; Department of Electrical and Computer Engineering, Center for Optical Materials Science and Engineering Technologies, Clemson University, Clemson, SC, 29634, USA., Vahala KJ; T. J. Watson Laboratory of Applied Physics, California Institute of Technology, Pasadena, CA, 91125, USA. vahala@caltech.edu., Bowers JE; Department of Electrical and Computer Engineering, University of California Santa Barbara, Santa Barbara, CA, 93106, USA. jbowers@ucsb.edu., Lin Q; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA. qiang.lin@rochester.edu.; Institute of Optics, University of Rochester, Rochester, NY, 14627, USA. qiang.lin@rochester.edu.
Publikováno v:
Nature communications [Nat Commun] 2022 Sep 12; Vol. 13 (1), pp. 5344. Date of Electronic Publication: 2022 Sep 12.
Autor:
Graf A; Institute of Optics, University of Rochester, Rochester, New York 14627, USA.; Center for Coherence and Quantum Optics, University of Rochester, Rochester, New York 14627, USA., Rogers SD; John Hopkins University, Applied Physics Laboratory, Laurel, Maryland 20723, USA., Staffa J; Institute of Optics, University of Rochester, Rochester, New York 14627, USA.; Center for Coherence and Quantum Optics, University of Rochester, Rochester, New York 14627, USA., Javid UA; Institute of Optics, University of Rochester, Rochester, New York 14627, USA.; Center for Coherence and Quantum Optics, University of Rochester, Rochester, New York 14627, USA., Griffith DH; Department of Physics, Wellesley College, Wellesley, Massachusetts 02841, USA., Lin Q; Institute of Optics, University of Rochester, Rochester, New York 14627, USA.; Center for Coherence and Quantum Optics, University of Rochester, Rochester, New York 14627, USA.; Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York 14627, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2022 May 27; Vol. 128 (21), pp. 213605.
Autor:
Javid UA; Institute of Optics, University of Rochester, Rochester, New York 14627, USA., Ling J; Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York 14627, USA., Staffa J; Institute of Optics, University of Rochester, Rochester, New York 14627, USA., Li M; Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York 14627, USA., He Y; Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York 14627, USA., Lin Q; Institute of Optics, University of Rochester, Rochester, New York 14627, USA.; Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York 14627, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2021 Oct 29; Vol. 127 (18), pp. 183601.
Autor:
Li M; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., Ling J; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., He Y; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA., Javid UA; Institute of Optics, University of Rochester, Rochester, NY, 14627, USA., Xue S; Institute of Optics, University of Rochester, Rochester, NY, 14627, USA., Lin Q; Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, 14627, USA. qiang.lin@rochester.edu.; Institute of Optics, University of Rochester, Rochester, NY, 14627, USA. qiang.lin@rochester.edu.
Publikováno v:
Nature communications [Nat Commun] 2020 Aug 17; Vol. 11 (1), pp. 4123. Date of Electronic Publication: 2020 Aug 17.
Shallow-etched thin-film lithium niobate waveguides for highly-efficient second-harmonic generation.
Publikováno v:
Optics express [Opt Express] 2020 Jun 22; Vol. 28 (13), pp. 19669-19682.