Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Jason R. Heffelfinger"'
Autor:
Jason R. Heffelfinger, Kevin M. Gaffney, Joachim Hossick-Schott, Mike Ringle, Markus Reiterer, Iryna M. Levina, Mike Hintz
Publikováno v:
JOM. 65:625-629
Establishing electrical interconnects in implantable electronic medical devices frequently requires joining of dissimilar materials. A weld between a tantalum wire and titanium sheet metal on a contact module is presented as an example for dissimilar
Publikováno v:
Journal of Applied Physics. 85:466-472
Conventional and high-resolution transmission electron microscopy are used to characterize the initial stages of AlN thin-film growth. AlN films are deposited by molecular beam epitaxy onto annealed (0001) oriented α-Al2O3 (sapphire) substrates. Dur
Autor:
Elizabeth Rosario, John C. Lippold, Jason C. Myers, Jason R. Heffelfinger, Antonio J. Ramirez, Dan Sorensen, Jong Seok Jeong
Publikováno v:
Microscopy and Microanalysis. 21:2425-2426
Autor:
E. Cross, C. L. Lingren, Arnold Burger, Jason R. Heffelfinger, Tuviah E. Schlesinger, Michael M. Schieber, J.C. Lund, E. Y. Lee, Henry Chen, Haim Hermon, N. R. Hilton, Ralph B. James, W. Yao, F. P. Doty, Mark S. Goorsky, James E. Toney, R.W. Olsen, B. A. Brunett, J. M. Van Scyoc, H. Yoon
Publikováno v:
Journal of Electronic Materials. 27:788-799
The material showing the greatest promise today for production of large-volume gamma-ray spectrometers operable at room temperature is cadmium zinc telluride (CZT). Unfortunately, because of deficiencies in the quality of the present material, high-r
Publikováno v:
Journal of Materials Research. 13:1414-1417
Thin films of wurtzitic AlN have been deposited by molecular-beam epitaxy onto (001) oriented MgO substrates. The films are epitactic and align with the and the , as evidenced by transmission electron microscopy. This configuration, which matches a c
Autor:
Jason R. Heffelfinger, C. Barry Carter
Publikováno v:
Surface Science. 389:188-200
The progression of surface faceting on ceramic substrates is explored using the {1010} and (0001) surfaces of Al2O3 (α-Al2O3, corundum structure) as model systems. Atomic-force microscopy and electron microscopy techniques are used to monitor the pr
Autor:
C. Barry Carter, Jason R. Heffelfinger
Publikováno v:
Philosophical Magazine Letters. 76:223-232
Thin-films of yttria-stabilized zirconia (YSZ) and Y O (cubic structure) have 2 3 been grown on annealed substrates of (0001) and {1010} Al O (alpha-Al O, 2 3 2 3 corundum structure) by pulsed-laser deposition. These model systems demonstrate the eff
Publikováno v:
Journal of Microscopy. 185:217-224
Understanding the solid-state reactions involved in metal/ceramic systems is important when combining the two types of materials into a composite. In this investigation, the solid-state reaction between Al2O3 (alumina) and a β-Ti alloy has been char
Publikováno v:
ResearcherID
Solid-state reactions are known to occur in composite materials during fabrication, processing or service. In the present study, a model approach for studying such reactions is illustrated. The goal of this approach is to understand the effects of, f
Publikováno v:
Surface Science. 370:L168-L172
The initial stages of facet formation on the (0001) α-alumina surface are explored through annealing vicinal single crystals for different lengths of time and characterizing the surface with atomic force microscopy. Faceting of the (0001) surface be