Zobrazeno 1 - 10
of 62
pro vyhledávání: '"Jason L. Pitters"'
Autor:
Mohammad Rashidi, Jacob A. J. Burgess, Marco Taucer, Roshan Achal, Jason L. Pitters, Sebastian Loth, Robert A. Wolkow
Publikováno v:
Nature Communications, Vol 7, Iss 1, Pp 1-7 (2016)
Probing individual impurities will become increasingly important as devices shrink towards the nanoscale. Here Rashidi et al., introduce a method based on time-resolved scanning tunnelling spectroscopy of surface dangling bonds to investigate the dyn
Externí odkaz:
https://doaj.org/article/2d1bb8e3bd82405f904f9b1186ba6e60
Publikováno v:
ACS Nano. 15:19377-19386
We used multiprobe scanning tunneling microscope (STM) to fabricate and electrically characterize nanostructures on Si surfaces. We overcame resistive contacts by using field evaporation to clean tip apexes in order to create Ohmic contact with the S
Autor:
Lucian Livadaru, Peng Xue, Zahra Shaterzadeh-Yazdi, Gino A DiLabio, Josh Mutus, Jason L Pitters, Barry C Sanders, Robert A Wolkow
Publikováno v:
New Journal of Physics, Vol 19, Iss 11, p 119501 (2017)
Externí odkaz:
https://doaj.org/article/a1400ef8b350484c9d3ac892ff7d03cd
Autor:
John A. Wood, Mohammad Rashidi, Robert A. Wolkow, Jason L. Pitters, Taleana Huff, Jeremiah Croshaw, Erika Lloyd
Using a non-contact atomic force microscope (nc-AFM), we examine continuous dangling bond (DB) wire structures patterned on the hydrogen terminated silicon (100)-2 × 1 surface. By probing the DB structures at varying energies, we identify the format
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d846c15ead31a358d922f1399ab8a176
https://nrc-publications.canada.ca/eng/view/object/?id=c43bf639-0397-44d6-9c4c-b85640dfbe2d
https://nrc-publications.canada.ca/eng/view/object/?id=c43bf639-0397-44d6-9c4c-b85640dfbe2d
Autor:
Darren Homeniuk, Sean Chen, Drew Price, Ray F. Egerton, Karan Kumar, Marek Malac, Misa Hayashida, Jason L. Pitters, Martin Cloutier, D. Vick, Jesus Alejandro Marin-Calzada, Mark Salomons, Darren Wen
Publikováno v:
Microscopy and Microanalysis. 27:1062-1063
Autor:
Seigi Mizuno, Radovan Urban, Jason L. Pitters, Rezwan Ahmed, Robert A. Wolkow, Martin Cloutier, Mark Salomons
Publikováno v:
Ultramicroscopy. 223
A simple and cost effective method to fabricate multiple tungsten (W) single atom tips (SATs) from both poly and single crystalline wires is reported. Two or four tips attached to a holder are electrochemically etched together in NaOH solution follow
Autor:
Drew Price, Jason L. Pitters, Misa Hayashida, Suliat Yakubu, D. Vick, Marek Malac, Marcus Leeson, Sean Chen, Mark Salomons, Ray F. Egerton, Darren Homeniuk, Martin Cloutier
We are developing a modular (scanning) transmission electron microscope (S)TEM, referred to as NanoMi, which is released under an open source license by the National Research Council, Canada; see for updates. The electron microscope (EM) is a critica
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::15ebeef09b39e12ee951841d9f7111f7
https://doi.org/10.1017/s1431927620019431
https://doi.org/10.1017/s1431927620019431
Autor:
Robert A. Wolkow, Taleana Huff, Roshan Achal, Martin Cloutier, Jeremiah Croshaw, Jason L. Pitters, David Churchill, Marco Taucer, Mohammad Rashidi
Publikováno v:
Nature Communications, Vol 9, Iss 1, Pp 1-8 (2018)
Nature Communications
Nature Communications
At the atomic scale, there has always been a trade-off between the ease of fabrication of structures and their thermal stability. Complex structures that are created effortlessly often disorder above cryogenic conditions. Conversely, systems with hig
Publikováno v:
AIP Advances, Vol 10, Iss 10, Pp 105213-105213-5 (2020)
Multi-probe scanning tunneling microscopy can play a role in various electrical measurements and characterization of nanoscale objects. The consistent close placement of multiple probes relies on very sharp apexes with no other interfering materials
Publikováno v:
Ultramicroscopy. 196
We studied the charging behavior of an amorphous carbon thin film kept at liquid-nitrogen temperature under focused electron-beam irradiation. Negative charging of the thin film is observed. The charging is attributed to a local change in the work fu