Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Jason Goertz"'
Autor:
Brian Johnston, Chris Shaw, Steven Kasapi, Peter Ouimet, Jason Goertz, Tom Crawford, Radu Ispasoiu, Olivier Rinaudo
Publikováno v:
Microelectronics Reliability. 46:1504-1507
We have achieved a greater than 2.5× improvement in the acquisition time figure of merit of an EmiScope™ Time Resolved photon Emission (TRE)-based probe system, by optimization of the detector dark-count rate, photon detection efficiency, and timi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7e83094f47ea449ec57b612442c2854
https://doi.org/10.1016/j.microrel.2006.07.026
https://doi.org/10.1016/j.microrel.2006.07.026
Publikováno v:
International Symposium for Testing and Failure Analysis.
In this paper, we report a transistor model that has successfully led to the identification of a non visual defect. This model was based on detailed electrical characterization of a MOS NFET exhibiting a threshold voltage (Vt) of just about 40mv lowe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d614c249b84831f4575ce0f520ea0714
https://doi.org/10.31399/asm.cp.istfa2012p0106
https://doi.org/10.31399/asm.cp.istfa2012p0106
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper describes case histories of 0.13 um bulk CMOS technology analyses using Time Resolved Light Emission (TRLEM). Using this technique, scan chain, timing, and logic failures are shown to be quickly and decisively identified thereby meeting th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4444d2b705ac62052d67528ae55e0826
https://doi.org/10.31399/asm.cp.istfa2004p0203
https://doi.org/10.31399/asm.cp.istfa2004p0203
Publikováno v:
Proceedings International Test Conference; 2002, p664-672, 9p
Autor:
EDFAS Organizing Committee
This title features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detec
Autor:
Michael Lang, Michaela Müller
Zentrale IT-Themen kennen, einschätzen und für das eigene Unternehmen nutzen!Big Data Analytics, Künstliche Intelligenz, Augmented Reality & Co.: Im IT-Umfeld gibt es immer mehr Entwicklungen, die als erfolgskritisch für Unternehmen gelten und ü