Zobrazeno 1 - 10
of 42
pro vyhledávání: '"Jason Cleveland"'
Publikováno v:
Computational Statistics & Data Analysis. 125:10-26
Registration, or alignment, of functional observations has been a fundamental problem in functional data analysis. The creation of a template was the key step for alignment of a group of functions. Recent studies have defined the template with the no
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d70376b6ef7ee518828be81788a3fb0b
https://doi.org/10.1016/j.csda.2018.03.009
https://doi.org/10.1016/j.csda.2018.03.009
Publikováno v:
Journal of Nonparametric Statistics. 28:338-359
Registration of temporal observations is a fundamental problem in functional data analysis. Various frameworks have been developed over the past two decades where registrations are conducted based on optimal time warping between functions. Comparison
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca853b52a142759244c1b3a4ca500004
https://doi.org/10.1080/10485252.2016.1163353
https://doi.org/10.1080/10485252.2016.1163353
Autor:
Monteith G. Heaton, Jason Cleveland
Publikováno v:
Microscopy Today. 17:26-29
Over the past decade, Atomic Force/Scanning Probe Microscopy (AFM/SPM) has emerged as the leading tool for investigations at the nanoscale – doing everything from imaging, to compositional differentiation, to explorations of molecular forces. Howev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed0e9c364fd5484f915d04a57b97bbde
https://doi.org/10.1017/s1551929500054456
https://doi.org/10.1017/s1551929500054456
Publikováno v:
Scanning. 17:117-121
The microfabricated silicon nitride cantilevers that are used for atomic force microscopy (AFM) are, unfortunately, sensitive thermometers. They bend with ambient temperature changes and those due to laser heating. The bend can result in displacement
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f185881089801ee30ba941749f32c18
https://doi.org/10.1002/sca.4950170208
https://doi.org/10.1002/sca.4950170208
Publikováno v:
Nanotechnology. 15:1344-1350
One of the most popular methods for calibrating the spring constant of an atomic force microscope cantilever is the thermal noise method. The usual implementation of this method has been to position the focused optical spot on or near the end of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48b5dea37ea1119e5aaef7398121ed6d
https://doi.org/10.1088/0957-4484/15/9/039
https://doi.org/10.1088/0957-4484/15/9/039
Autor:
Jason Cleveland, John E. Sader, Christopher P. Green, Hadi Lioe, Roger Proksch, Paul Mulvaney
Publikováno v:
Review of Scientific Instruments. 75:1988-1996
Two methods commonly used to measure the normal spring constants of atomic force microscope cantilevers are the added mass method of Cleveland et al. [J. P. Cleveland et al., Rev. Sci. Instrum. 64, 403 (1993)], and the unloaded resonance technique of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ebf6cabae685908c7610dcc31b91253a
https://doi.org/10.1063/1.1753100
https://doi.org/10.1063/1.1753100
Publikováno v:
Review of Scientific Instruments. 73:3232-3241
This article presents the design, identification, and control of a nano-positioning device suited to image biological samples as part of an atomic force microscope. The device is actuated by a piezoelectric stack and its motion is sensed by a linear
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::84cba0a72293124520adf84c85fe337d
https://doi.org/10.1063/1.1499533
https://doi.org/10.1063/1.1499533
Publikováno v:
Journal of Applied Physics. 89:6473-6480
The atomic force microscope (AFM) is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::10ca2ccfe837440fae76201570738c3f
https://doi.org/10.1063/1.1365440
https://doi.org/10.1063/1.1365440
Publikováno v:
Physical Review B. 61:1106-1115
In this article tapping-mode atomic force microscope dynamics is studied. The existence of a periodic orbit at the forcing frequency is shown under unrestrictive conditions. The dynamics is further analyzed using the impact model for the tip-sample i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45ee159e898639af93be01a490bf5ec2
https://doi.org/10.1103/physrevb.61.1106
https://doi.org/10.1103/physrevb.61.1106
Publikováno v:
Applied Surface Science. 140:376-382
When studying a mechanical system like an atomic force microscope (AFM) in dynamic mode it is intuitive and instructive to analyse the forces involved in tip–sample interaction. A different but complementary approach is based on analysing the energ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b795f01034ca625faa8b2401f6149e6
https://doi.org/10.1016/s0169-4332(98)00558-3
https://doi.org/10.1016/s0169-4332(98)00558-3