Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Jaroslav Solovjov"'
Autor:
Vasilina Lapitskaya, Ruslan Trukhan, Tatyana Kuznetsova, Jaroslav Solovjov, Sergei Chizhik, Vladimir Pilipenko, Karyna Liutsko, Anastasiya Nasevich, Maksim Douhal
Publikováno v:
Surfaces, Vol 7, Iss 2, Pp 196-207 (2024)
Nickel films of 40 nm thickness were obtained by means of magnetron sputtering on a single-crystalline silicon substrate. The films were subjected to rapid thermal treatment (RTT) for 7 s until the temperature increased from 200 to 550 °C. By means
Externí odkaz:
https://doaj.org/article/69fdf69855d04801a14aae62e8b83db2
Autor:
Tatyana Kuznetsova, Vasilina Lapitskaya, Jaroslav Solovjov, Sergei Chizhik, Vladimir Pilipenko, Sergei Aizikovich
Publikováno v:
Nanomaterials, Vol 11, Iss 7, p 1734 (2021)
The changes in the morphology and the electrophysical properties of the Cr/n-Si (111) structure depending on the rapid thermal treatment were considered in this study. The chromium films of about 30 nm thickness were deposited via magnetron sputterin
Externí odkaz:
https://doaj.org/article/7e612388d3444a9d8c920ce5e4f11b45
Autor:
V. A. Lapitskaya, Sergei M. Aizikovich, Jaroslav Solovjov, Sergei A. Chizhik, Tatyana A. Kuznetsova, Vladimir Pilipenko
Publikováno v:
Nanomaterials
Volume 11
Issue 7
Nanomaterials, Vol 11, Iss 1734, p 1734 (2021)
Volume 11
Issue 7
Nanomaterials, Vol 11, Iss 1734, p 1734 (2021)
The changes in the morphology and the electrophysical properties of the Cr/n-Si (111) structure depending on the rapid thermal treatment were considered in this study. The chromium films of about 30 nm thickness were deposited via magnetron sputterin