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of 5
pro vyhledávání: '"Jaromír Bačovský"'
Autor:
Jaromír Bačovský
Publikováno v:
MethodsX, Vol 5, Iss , Pp 1033-1047 (2018)
Further development of low voltage electron microscopy leads to an aberration correction of the device in order to improve its spatial resolution. The integration of a corrector to a desktop transmission electron microscope with exclusively low-volta
Externí odkaz:
https://doaj.org/article/5f3768e3ef1b4a0786d78a0b7fd44bb1
Autor:
Ondřej Solnička, Leona Kubíková, Jaromír Bačovský, Šárka Sovová, Petr Sedláček, Martina Klučáková, Miloslav Pekař, Vojtěch Enev
Publikováno v:
NANOCON Conference Proeedings.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9864ca789fff2ec9f2e214e9d89f2227
https://doi.org/10.37904/nanocon.2022.4597
https://doi.org/10.37904/nanocon.2022.4597
Autor:
Vladimír Kolařík, Jaromír Bačovský
Publikováno v:
Ultramicroscopy. 212
In recent years, aberration correction has slowly become standard in high-end conventional transmission electron microscopy (50-200 kV). However, the integration of correctors to low voltage transmission systems (5-25 kV) has proved to be difficult.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::23cdb41d88367c57a172457b441d35d3
https://pubmed.ncbi.nlm.nih.gov/32182539
https://pubmed.ncbi.nlm.nih.gov/32182539
Autor:
Jaromír Bačovský
Publikováno v:
MethodsX, Vol 5, Iss, Pp 1033-1047 (2018)
MethodsX. 2018, vol. 5, issue 1, p. 1033-1047.
MethodsX. 2018, vol. 5, issue 1, p. 1033-1047.
Further development of low voltage electron microscopy leads to an aberration correction of the device in order to improve its spatial resolution. The integration of a corrector to a desktop transmission electron microscope with exclusively low-volta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::909b9f9fcfb40f6c2c3f92097ae67d85
https://pubmed.ncbi.nlm.nih.gov/30225204
https://pubmed.ncbi.nlm.nih.gov/30225204
Autor:
Katerina Mrazova, Jaromir Bacovsky, Zuzana Sedrlova, Eva Slaninova, Stanislav Obruca, Ines Fritz, Vladislav Krzyzanek
Publikováno v:
Microorganisms, Vol 11, Iss 4, p 888 (2023)
Sample preparation protocols for conventional high voltage transmission electron microscopy (TEM) heavily rely on the usage of staining agents containing various heavy metals, most commonly uranyl acetate and lead citrate. However high toxicity, risi
Externí odkaz:
https://doaj.org/article/d00d0ba30ee548f89593c6e4618bef56