Artificial neural network modeling for improved coaxial line-reflect-match calibrations.

Autor: Jargon, J. A.¹ jargon@boulder.nist.gov, Gupta, K. C.²

Publikováno v: International Journal of RF & Microwave Computer-Aided Engineering. Jan2001, Vol. 11 Issue 1, p33-37. 5p. 2 Graphs.

Identification of a Strongly Nonlinear Device Compact Model Based on Vectorial Large Signal Measurements

Autor: Camprini, M., Cidronali, A., Accillaro, C., Magrini, I., Loglio, G., Collodi, G., Jargon, J., Manes, G.

Publikováno v: Camprini, M. ; Cidronali, A. ; Accillaro, C. ; Magrini, I. ; Loglio, G. ; Collodi, G. ; Jargon, J. ; Manes, G. (2004) Identification of a Strongly Nonlinear Device Compact Model Based on Vectorial Large Signal Measurements. In: Gallium Arsenide applications symposium. GAAS 2004, 11—12 Ottobre, Amsterdam.

This paper deals with the identification of equivalent circuit models for strongly nonlinear devices by taking advantage of the so-called “Vectorial Large-Signal Measurements”. A very specific device, the Heterojunction Interband Tunneling FET (H

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6260cc7e77b19c5e7aac19737dd239a2

A generalized definition of Power Gain Taking Harmonic Content into Account

Autor: Jargon, J., Gupta, K. C., Cidronali, A., Degroot, D.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______310::a7cc01bbea2c269cfab9de4833127791
http://hdl.handle.net/2158/203631

De-embedding method for a sensing area characterization of planar microstrip sensors without evaluating error networks.

Autor: Hasar, Ugur C.¹ (AUTHOR) uchasar@gantep.edu.tr, Ozturk, Hamdullah^1,2 (AUTHOR), Korkmaz, Huseyin¹ (AUTHOR), Nayyeri, Vahid³ (AUTHOR) nayyeri@iust.ac.ir, Ramahi, Omar M.⁴ (AUTHOR)

Publikováno v: Scientific Reports. 5/2/2024, Vol. 14 Issue 1, p1-16. 16p.

Phase drift effects in sampling microwave measurement systems.

Autor: LoogIio, G., Jargon, J., DeGroot, D.C., Popovic, Z.

Publikováno v: 65th ARFTG Conference Digest, 2005. Spring 2005; 2005, p165-168, 4p