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pro vyhledávání: '"Jared Hubbard"'
Autor:
Jared Hubbard
Publikováno v:
International Legal Materials. 59:239-251
On October 7, 2019, the United States Court of Appeals for the Second Circuit issued a decision in In re del Valle Ruiz that significantly expands the ability of parties to foreign legal proceedings to obtain discovery from U.S. courts. The Second Ci
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e749649507539463c764bd5b849df1b3
https://doi.org/10.1017/ilm.2020.15
https://doi.org/10.1017/ilm.2020.15
Publikováno v:
Marketing Opportunities and Challenges in a Changing Global Marketplace ISBN: 9783030391645
Customers are frequently being asked to make charitable donations at the cash register when making purchases. This growing trend of point of sale donations (POSD) brings in about $500 million for causes annually (Catalyst 2018). Research has examined
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff7c204313b860973fd77a8c0ed7b0ff
https://doi.org/10.1007/978-3-030-39165-2_157
https://doi.org/10.1007/978-3-030-39165-2_157
Autor:
Jared Hubbard
Publikováno v:
Alternatives to the High Cost of Litigation. 35:67-70
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::96e46857b8b7dd0691ff0889ee9906f4
https://doi.org/10.1002/alt.21686
https://doi.org/10.1002/alt.21686
Autor:
Mehul A. Trivedi, Roger F. Dickey, Paul Pinsukanjana, Jared Hubbard, Yung-Chung Kao, Philip S. Kao, J. Marquis, Sam P. Kuo, Jerry M.-S. Tsai
Publikováno v:
Journal of Crystal Growth. 251:124-129
Atomic absorption optical-based flux monitor (OFM) has been implemented as a non-invasive in situ measurement tool for production MBE operation. For our setup, the optical probe beam samples the group III beam fluxes (Al, Ga, and In) by passing just
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f6cd2140da9c388dadb9497762a139f
https://doi.org/10.1016/s0022-0248(02)02293-5
https://doi.org/10.1016/s0022-0248(02)02293-5
Publikováno v:
Journal of Crystal Growth. :238-243
In situ non-invasive process monitoring and control during semiconductor epitaxy is a potential enabling technology that can transform the existing approach to epi-wafer manufacturing. In this paper, we describe the implementation of a multi-sensor s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f16e8ea48b93b08c463fd726fdbcb7a1
https://doi.org/10.1016/s0022-0248(01)00690-x
https://doi.org/10.1016/s0022-0248(01)00690-x