Zobrazeno 1 - 10
of 716
pro vyhledávání: '"Jansson, U"'
Autor:
Fritze, S., Hahn, R., Aboulfadl, H., Johansson, F.O.L., Lindblad, R., Böőr, K., Lindblad, A., Berggren, E., Kühn, D., Leitner, T., Osinger, B., Lewin, E., Jansson, U., Mayrhofer, P.H., Thuvander, M.
Publikováno v:
In Surface & Coatings Technology 15 February 2024 477
Publikováno v:
Thin Solid Films, 2019
We present an assessment of a multi-method approach based on ion beam analysis to obtain high-resolution depth profiles of the total chemical composition of complex alloy systems. As a model system we employ an alloy based on several transition metal
Externí odkaz:
http://arxiv.org/abs/1812.10340
Autor:
Mukhamedov, B.O., Fritze, S., Ottosson, M., Osinger, B., Lewin, E., Alling, B., Jansson, U., Abrikosov, I.A.
Publikováno v:
In Materials & Design February 2022 214
Autor:
Fritze, S., Chen, M., Riekehr, L., Osinger, B., Sortica, M.A., Srinath, A., Menon, A.S., Lewin, E., Primetzhofer, D., Wheeler, J.M., Jansson, U.
Publikováno v:
In Materials & Design October 2021 208
Publikováno v:
In Surface & Coatings Technology 15 December 2020 403
Publikováno v:
In Materials & Design November 2020 196
Autor:
Kadas, K., Andersson, M., Holmstrom, E., Wende, H., Karis, O., Urbonaite, S., Butorin, S. M., Nikitenko, S., Kvashnina, K. O., Jansson, U., Eriksson, O.
By means of theoretical modeling and experimental synthesis and characterization, we investigate the structural properties of amorphous Zr-Si-C. Two chemical compositions are selected, Zr0.31Si0.29C0.40 and Zr0.60Si0.33C0.07. The amorphous structures
Externí odkaz:
http://arxiv.org/abs/1203.5876
Autor:
Magnuson, M., Palmquist, J. -P., Mattesini, M., Li, S., Ahuja, R., Eriksson, O., Emmerlich, J., Wilhelmsson, O., Eklund, P., Högberg, H., Hultman, L., Jansson, U.
Publikováno v:
Physical Review B 72, 245101 (2005)
The electronic structures of epitaxially grown films of Ti3AlC2, Ti3SiC2 and Ti3GeC2 have been investigated by bulk-sensitive soft X-ray emission spectroscopy. The measured high-resolution Ti L, C K, Al L, Si L and Ge M emission spectra are compared
Externí odkaz:
http://arxiv.org/abs/1112.6360
Autor:
Magnuson, M., Mattesini, M., Wilhelmsson, O., Emmerlich, J., Palmquist, J. -P., Li, S., Ahuja, R., Hultman, L., Eriksson, O., Jansson, U.
Publikováno v:
Physical Review B 74, 205102 (2006)
The electronic structure in the new transition metal carbide Ti4SiC3 has been investigated by bulk-sensitive soft x-ray emission spectroscopy and compared to the well-studied Ti3SiC2 and TiC systems. The measured high-resolution Ti L, C K and Si L x-
Externí odkaz:
http://arxiv.org/abs/1112.6342
Electronic structure and chemical bonding in Ti2AlC investigated by soft x-ray emission spectroscopy
Autor:
Magnuson, M., Wilhelmsson, O., Palmquist, J. -P., Jansson, U., Mattesini, M., Li, S., Ahuja, R., Eriksson, O.
Publikováno v:
Physical Review B 74, 195108 (2006)
The electronic structure of the nanolaminated transition metal carbide Ti2AlC has been investigated by bulk-sensitive soft x-ray emission spectroscopy. The measured Ti L, C K and Al L emission spectra are compared with calculated spectra using ab ini
Externí odkaz:
http://arxiv.org/abs/1111.2910