Zobrazeno 1 - 10
of 54
pro vyhledávání: '"Janssen, H. H."'
Autor:
Janssen, H. H., author1
Publikováno v:
Oscan and Umbrian Inscriptions: With a Latin Translation. :34-52
Autor:
Janssen, H. H., author1
Publikováno v:
Oscan and Umbrian Inscriptions: With a Latin Translation. :8-34
Autor:
Lenczowski, S. K. J., Veerdonk, R. J. M. van de, Gijs, M. A. M., Giesbers, J. B., Janssen, H. H. J. M.
Publikováno v:
Journal of Applied Physics; 5/15/1994, Vol. 75 Issue 10, p5154, 6p, 1 Black and White Photograph, 3 Diagrams, 3 Graphs
Autor:
Gijs, M. A. M., Giesbers, J. B., Johnson, M. T., aan de Stegge, J. B. F., Janssen, H. H. J. M., Lenczowski, S. K. J., van de Veerdonk, R. J. M., de Jonge, W. J. M.
Publikováno v:
Journal of Applied Physics; 5/15/1994, Vol. 75 Issue 10, p6709, 5p, 3 Diagrams, 3 Graphs
Autor:
Alessandro Di Bucchianico, E J W Maten, Ter, Pulch, R., Janssen, H. H. J. M., Niehof, J., Hanssen, M., Kapora, S.
Publikováno v:
Radioengineering. 2014, vol. 23, č. 1, s. 308-318. ISSN 1210-2512
Radioengineering, Vol 23, Iss 1, Pp 308-318 (2014)
Pure TUe
RadioEngineering, 23(1), 308-318. Czech Technical University in Prague
Radioengineering, Vol 23, Iss 1, Pp 308-318 (2014)
Pure TUe
RadioEngineering, 23(1), 308-318. Czech Technical University in Prague
Modern communication and identification products impose demanding constraints on reliability of components. Due to this, statistical constraints more and more enter optimization formulations of electronic products. Yield constraints often require eff
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::8ccfd686476b70c1be71df4f437ffe58
https://hdl.handle.net/11012/36422
https://hdl.handle.net/11012/36422
Autor:
Doorn, T. S., E J W Maten, Ter, Alessandro Di Bucchianico, Beelen, T. G. J., Janssen, H. H. J. M.
Publikováno v:
Proceedings of 22nd International Conference Radioelektronika 2012 (Brno, Czech Republic, April 17-18, 2012), 219-222
STARTPAGE=219;ENDPAGE=222;TITLE=Proceedings of 22nd International Conference Radioelektronika 2012 (Brno, Czech Republic, April 17-18, 2012)
Pure TUe
STARTPAGE=219;ENDPAGE=222;TITLE=Proceedings of 22nd International Conference Radioelektronika 2012 (Brno, Czech Republic, April 17-18, 2012)
Pure TUe
A product may fail when design parameters are subject to large deviations. To guarantee yield one likes to determine bounds on the parameter range such that the fail probability P fail is small. For Static Random Access Memory (SRAM) characteristics
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4e3c6e305837b24d983efb2c86450b9b
https://research.tue.nl/nl/publications/6cb41470-a438-4984-86b4-0f4c0501cd78
https://research.tue.nl/nl/publications/6cb41470-a438-4984-86b4-0f4c0501cd78
Autor:
Janssen, H. H.
Publikováno v:
Vigiliae Christianae, 1955 Apr 01. 9(2), 188-191.
Externí odkaz:
https://www.jstor.org/stable/1582674
Autor:
Janssen, H. H.
Publikováno v:
Mnemosyne, 1961 Jan 01. 14(2), 184-187.
Externí odkaz:
https://www.jstor.org/stable/4428499
Publikováno v:
Progress in Industrial Mathematics at ECMI 2012; 2014, p361-370, 10p
Autor:
Bock, Hans-Georg, de Hoog, Frank, Friedman, Avner, Gupta, Arvind, Neunzert, Helmut, Pulleyblank, William R., Rusten, Torgeir, Santosa, Fadil, Tornberg, Anna-Karin, Ciuprina, Gabriela, Ioan, Daniel, Janssen, H. H. J. M., Niehof, J., Schilders, W. H. A.
Publikováno v:
Scientific Computing in Electrical Engineering (9783540719793); 2007, p81-87, 7p