Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Janse van Vuuren Arno"'
Publikováno v:
MATEC Web of Conferences, Vol 406, p 07015 (2024)
The effect of processing parameters on the microstructure was investigated on three α+β alloys, namely Ti6Al4V (Ti64), Ti6Al2Sn4Zr6Mo (Ti6246) and Ti6.5Al3.5Mo1.5Zr0.3Si (TC11) fabricated by laser powder bed fusion (LPBF). Electron Backscattered Di
Externí odkaz:
https://doaj.org/article/b3ecae25ab4e477b9b8d95acf55e9743
Publikováno v:
In Vacuum February 2024 220
Autor:
Suliali, Nyasha J., Goosen, William E., Janse van Vuuren, Arno, Olivier, Ezra J., Bakhit, Babak, Högberg, Hans, Darakchieva, Vanya, Botha, Johannes R.
Publikováno v:
In Vacuum January 2022 195
Autor:
Janse van Vuuren, Arno, Ibrayeva, Anel D., O'Connell, Jacques H., Skuratov, Vladimir A., Mutali, Alisher, Zdorovets, Maxim V.
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B 15 June 2020 473:16-23
Publikováno v:
In Ceramics International 15 April 2020 46(6):7155-7160
Autor:
Gandidzanwa, Sendibitiyosi, Beukes, Natasha, Joseph, Sinelizwi V, Janse Van Vuuren, Arno, Mashazi, Philani, Britton, Jonathan, Kilian, Gareth, Roux, Saartjie, Nyokong, Tebello, Lee, Michael E, Frost, Carminita L, Tshentu, Zenixole R
Publikováno v:
Nanotechnology; 11/12/2023, Vol. 34 Issue 46, p1-15, 15p
Publikováno v:
Dalton Transactions: An International Journal of Inorganic Chemistry; 1/7/2023, Vol. 52 Issue 1, p70-80, 11p
Autor:
Janse van Vuuren, Arno, Mutali, Alisher, Ibrayeva, Anel, Sohatsky, Alexander, Skuratov, Vladimir, Akilbekov, Abdirash, Dauletbekova, Alma, Zdorovets, Maxim
Publikováno v:
Crystals (2073-4352); Oct2022, Vol. 12 Issue 10, p1410-N.PAG, 7p
Autor:
Lambrechts, Isa A., Thipe, Velaphi C., Katti, Kattesh V., Mandiwana, Vusani, Kalombo, Michel Lonji, Ray, Suprakas Sinha, Rikhotso, Rirhandzu, Janse van Vuuren, Arno, Esmear, Tenille, Lall, Namrita
Publikováno v:
Pharmaceuticals (14248247); Aug2022, Vol. 15 Issue 8, p933-933, 18p
Секция 2. Радиационные эффекты в твердом теле = Section 2. Radiation Effects in Solids Probe-Cs-corrected high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) is used to image loo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1594::599d7d38e328135d499bb284406fa395
http://elib.bsu.by/handle/123456789/233878
http://elib.bsu.by/handle/123456789/233878
