Zobrazeno 1 - 10
of 93
pro vyhledávání: '"Jannis, Daen"'
By working out the Bethe sum rule, a boundary condition that takes the form of a linear equality is derived for the fine structure observed in ionization edges present in electron energy-loss spectra. This condition is subsequently used as a constrai
Externí odkaz:
http://arxiv.org/abs/2408.11870
Autor:
Zhang, Zezhong, Lobato, Ivan, Brown, Hamish, Lamoen, Dirk, Jannis, Daen, Verbeeck, Johan, Van Aert, Sandra, Nellist, Peter D.
The rich information of electron energy-loss spectroscopy (EELS) comes from the complex inelastic scattering process whereby fast electrons transfer energy and momentum to atoms, exciting bound electrons from their ground states to higher unoccupied
Externí odkaz:
http://arxiv.org/abs/2405.10151
Autor:
Folkers, Bart, Jansen, Thies, Roskamp, Thijs J., Reith, Pim, Timmermans, André, Jannis, Daen, Gauquelin, Nicolas, Verbeeck, Johan, Hilgenkamp, Hans, Rosário, Carlos M. M.
Publikováno v:
Phys. Rev. Materials 8, 054408,13 May 2024
LaMnO$_3$ (LMO) thin films epitaxially grown on SrTiO$_3$ (STO) usually exhibit ferromagnetism above a critical layer thickness. We report the use of scanning SQUID microscopy (SSM) to study the suppression of the ferromagnetism in STO/LMO/metal stru
Externí odkaz:
http://arxiv.org/abs/2310.05514
Publikováno v:
Ultramicroscopy 254 (2023) 113830
In this paper convexity constraints are derived for a background model of electron energy loss spectra (EELS) that is linear in the fitting parameters. The model outperforms a power-law both on experimental and simulated backgrounds, especially for w
Externí odkaz:
http://arxiv.org/abs/2308.15301
Autor:
Gauquelin, Nicolas, Forte, Filomena, Jannis, Daen, Fittipaldi, Rosalba, Autieri, Carmine, Cuono, Giuseppe, Granata, Veronica, Lettieri, Mariateresa, Noce, Canio, Granozio, Fabio Miletto, Vecchione, Antonio, Verbeeck, Johan, Cuoco, Mario
The control of Mott phase is intertwined with the spatial reorganization of the electronic states. Out-of-equilibrium driving forces typically lead to electronic patterns that are absent at equilibrium, whose nature is however often elusive. Here, we
Externí odkaz:
http://arxiv.org/abs/2305.19596
Autor:
Birkhölzer, Yorick A., Sotthewes, Kai, Gauquelin, Nicolas, Riekehr, Lars, Jannis, Daen, van der Minne, Emma, Bu, Yibin, Verbeeck, Johan, Zandvliet, Harold J. W., Koster, Gertjan, Rijnders, Guus
Publikováno v:
ACS Applied Electronic Materials 2022
Vanadium dioxide (VO2) is a popular candidate for electronic and optical switching applications due to its well-known semiconductor-metal transition. Its study is notoriously challenging due to the interplay of long and short range elastic distortion
Externí odkaz:
http://arxiv.org/abs/2210.07408
A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. With an algorithm requiring only the center of mass (COM) of the diffraction pattern at one probe position at a time, it is able to update the r
Externí odkaz:
http://arxiv.org/abs/2112.04442
Autor:
Jannis, Daen, Hofer, Christoph, Gao, Chuang, Xie, Xiaobin, Béché, Armand, Pennycook, Timothy J., Verbeeck, Jo
Four dimensional scanning transmission electron microscopy (4D STEM) records the scattering of electrons in a material in great detail. The benefits offered by 4D STEM are substantial, with the wealth of data it provides facilitating for instance hig
Externí odkaz:
http://arxiv.org/abs/2107.02864
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtained. This is especially problematic in the case of zeolites, organic an
Externí odkaz:
http://arxiv.org/abs/2105.01617
Autor:
Mary Joy, Rani, Pobedinskas, Paulius, Baule, Nina, Bai, Shengyuan, Jannis, Daen, Gauquelin, Nicolas, Pinault-Thaury, Marie-Amandine, Jomard, François, Sankaran, Kamatchi Jothiramalingam, Rouzbahani, Rozita, Lloret, Fernando, Desta, Derese, D’Haen, Jan, Verbeeck, Johan, Becker, Michael Frank, Haenen, Ken
Publikováno v:
In Acta Materialia 1 January 2024 264
