Zobrazeno 1 - 10
of 526
pro vyhledávání: '"Janicki M"'
Publikováno v:
Dans 13th International Worshop on THERMal INvestigations of ICs and Systems - THERMINIC 2007, Budapest : Hongrie (2007)
This paper presents thermal analyses of a power amplifier placed in a wind tunnel. All the investigations are based on the transient temperature measurements performed during the circuit cooling process. The measured cooling curves were used to compu
Externí odkaz:
http://arxiv.org/abs/0801.0865
Publikováno v:
Dans Proceedings of 12th International Workshop on Thermal investigations of ICs - THERMINIC 2006, Nice : France (2006)
This paper presents dynamic thermal analyses of a power amplifier. All the investigations are based on the transient junction temperature measurements performed during the circuit cooling process. The presented results include the cooling curves, the
Externí odkaz:
http://arxiv.org/abs/0709.1818
Autor:
Avdeyev, S. P., Karnaukhov, V. A., Petrov, L. A., Rodionov, V. K., Rukoyatkin, P. A., Toneev, V. D., Oeschler, H., Bochkarev, O. V., Chulkov, L. V., Kuzmin, E. A., Budzanovski, A., Karcz, W., Janicki, M., Norbeck, E., Botvina, A. S., Gudima, K. K.
Publikováno v:
Nucl.Phys. A709 (2002) 392-414
Multiple emission of intermediate-mass fragments has been studied for the collisions of p, $^4$He and $^{12}$C on Au with the $4\pi$ setup FASA. The mean IMF multiplicities (for the events with at least one IMF) are saturating at the value of $2.2\pm
Externí odkaz:
http://arxiv.org/abs/nucl-ex/0207001
Autor:
Avdeyev, S. P., Karnaukhov, V. A., Petrov, L. A., Rodionov, V. K., Toneev, V. D., Oeschler, H., Bochkarev, O. V., Chulkov, L. V., Kuzmin, E. A., Budzanowski, A., Karcz, W., Janicki, M., Norbeck, E., Botvina, A. S.
Publikováno v:
Phys.Lett. B503 (2001) 256-262
Multiple emission of intermediate-mass fragments has been studied for the collisions of p, $^4$He and $^{12}$C on Au with the $4\pi$ setup FASA. In the case of $^{12}$C(22.4 GeV)+Au and $^4$He(14.6 GeV)+Au collisions, the deviations from a pure therm
Externí odkaz:
http://arxiv.org/abs/nucl-ex/0102007
Publikováno v:
In Microelectronics Journal December 2014 45(12):1806-1813
Publikováno v:
In Microelectronics Journal July 2014 45(7):960-965
Publikováno v:
In Microelectronics Journal July 2013 44(7):619-622
Publikováno v:
In Microelectronics Journal July 2013 44(7):623-630
Autor:
Zubert, M., Starzak, L., Jablonski, G., Napieralska, M., Janicki, M., Pozniak, T., Napieralski, A.
Publikováno v:
In Microelectronics Journal May 2012 43(5):312-320
Akademický článek
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