Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range †.

Autor: Yoo, Dongsuk¹ (AUTHOR), Jang, Youngtae¹ (AUTHOR), Kim, Youngchan¹ (AUTHOR) ds.yoo@samsung.com, Shin, Jihun¹ (AUTHOR), Lee, Kangsun¹ (AUTHOR), Park, Seok-Yong¹ (AUTHOR), Shin, Seungho¹ (AUTHOR), Lee, Hongsuk¹ (AUTHOR), Kim, Seojoo¹ (AUTHOR), Park, Joongseok¹ (AUTHOR), Park, Cheonho¹ (AUTHOR), Lim, Moosup¹ (AUTHOR), Bae, Hyungjin¹ (AUTHOR), Park, Soeun¹ (AUTHOR), Jung, Minwook¹ (AUTHOR), Kim, Sungkwan¹ (AUTHOR), Choi, Shinyeol¹ (AUTHOR), Kim, Sejun¹ (AUTHOR), Heo, Jinkyeong¹ (AUTHOR), Lee, Hojoon¹ (AUTHOR)

Publikováno v: Sensors (14248220). Nov2023, Vol. 23 Issue 22, p9150. 10p.